Abstract
The true secondary electron yield under the conditions of X-ray dynamic diffraction from perfect crystals and crystals with a damaged surface layer has been theoretically and experimentally investigated. The reasons for the potential barrier modulation and the effect of this modulation on the ion and electron emission characteristics are considered.
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Original Russian Text © I.A. Seltzer, S.A. Kukushkin, E.N. Moos, 2008, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2008, Vol. 72, No. 7, pp. 926–930.
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Seltzer, I.A., Kukushkin, S.A. & Moos, E.N. Ion and electron emission characteristics at potential barrier modulation. Bull. Russ. Acad. Sci. Phys. 72, 873–877 (2008). https://doi.org/10.3103/S1062873808070010
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DOI: https://doi.org/10.3103/S1062873808070010