Abstract
We present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber. In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer.
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Chlebus, R., Hlubina, P. & Ciprian, D. Direct measurement of group dispersion of optical components using white-light spectral interferometry. Opto-Electron. Rev. 15, 144–148 (2007). https://doi.org/10.2478/s11772-007-0010-z
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DOI: https://doi.org/10.2478/s11772-007-0010-z