Abstract
The materials science community is poised to take advantage of new technologies that add unprecedented time resolution to already existing spatial-resolution capabilities. In the same way that chemists and biologists are using ultrafast optical, photon, and particle techniques to reveal transition pathways, materials scientists can expect to use variations of these methods to probe the most fundamental aspects of complex transient phenomena in materials. The combination of high-spatial-resolution imaging with high time resolution is critical because it enables the observation of specific phenomena that are important to developing fundamental understanding. Such a capability is also important because it enables experiments that are on the same time and length scales as recent high-performance computer simulations. This article describes several new techniques that have great potential for broader application in materials science, including electron, x-ray, and γ-ray imaging.
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H.C. Sorby, J. Iron & Steel Inst. 30 (1886) p. 140.
H.C. Sorby, J. Iron & Steel Inst. 31 (1887) p. 255.
P.B. Hirsch, R.W. Horne, and M.J. Whelan, Philos. Mag. 1 (1956) p. 677.
Y. Glinec, J. Faure, L.L. Dain, S. Darbon, T. Hosokai, J.J. Santos, E. Lefebvre, J.P. Rousseau, F. Burgy, B. Mercier, and V. Malka, Phys. Rev. Lett. 94 025003 (2005).
W.E. King, G.H. Campbell, A. Frank, B. Reed, J.F. Schmerge, B.J. Siwick, B.C. Stuart, and P.M. Weber, J. Appl. Phys. 97 111101 (2005).
O. Bostanjoglo, Adv. Imaging & Electron Phys. 121 (2002) p. 1.
H. Dömer and O. Bostanjoglo, Rev. Sci. Instrum. 74 (2003) p. 4369.
V.A. Lobastov, R. Srinivasan, and A.H. Zewail, Proc. Natl. Acad. Sci. USA 102 (2005) p. 7069.
A.H. Zewail, Philos. Trans. R. Soc. London, Ser. A 363 (2005) p. 315.
O. Bostanjoglo and T. Rosin, Phys. Status Solidi A 57 (1980) p. 561.
J.M. Thomas, Angew. Chem. Int. Ed. 44 (2005) p. 5563.
K.J. Gaffney, A.M. Lindenberg, J. Larsson, K. Sokolowski-Tinten, C. Blome, O. Synnergren, J. Sheppard, C. Caleman, A.G. MacPhee, D. Weinstein, D.P. Lowney, T. Allison, T. Matthews, R.W. Falcone, A.L. Cavalieri, D.M. Fritz, S.H. Lee, P.H. Bucksbaum, D.A. Reis, J. Rudati, A.T. Macrander, P.H. Fuoss, C.C. Kao, D.P. Siddons, R. Pahl, K. Moffat, J. Als-Nielsen, S. Duesterer, R. Ischebeck, H. Schlarb, H. Schulte-Schrepping, J. Schneider, D. von der Linde, O. Hignette, F. Sette, H.N. Chapman, R.W. Lee, T.N. Hansen, J.S. Wark, M. Bergh, G. Huldt, D. van der Spoel, N. Timneanu, J. Hajdu, R.A. Akre, E. Bong, P. Krejcik, J. Arthur, S. Brennan, K. Luening, and J.B. Hastings, Phys. Rev. Lett. 95 125701 (2005).
F. Schotte, M.H. Lim, T.A. Jackson, A.V. Smirnov, J. Soman, J.S. Olson, G.N. Phillips, M. Wulff, and P.A. Anfinrud, Science 300 (2003) p. 1944.
B.J. Siwick, J.R. Dwyer, R.E. Jordan, and R.J.D. Miller, Science 302 (2003) p. 1382.
B.J. Siwick, J.R. Dwyer, R.E. Jordan, and R.J.D. Miller, Chem. Phys. 299 (2004) p. 285.
G.H. Jansen, Coulomb Interactions in Particle Beams, Vol. 21 (Academic Press, San Diego, CA, 1990) p. 546.
J.A. Liddle, M.I. Blakey, K. Bolan, R.C. Farrow, G.M. Gallatin, R. Kasica, V. Katsap, C.S. Knurek, J. Li, M. Mkrtchyan, A.E. Novembre, L. Ocola, P.A. Orphanos, M.L. Peabody, S.T. Stanton, K. Teffeau, W.K. Waskiewicz, and E. Munro, J. Vac. Sci. Technol., B 19 (2001) p. 476.
E.M. James, N.D. Browning, A.W. Nicholls, M. Kawasaki, Y. Xin, and S. Stemmer, J. Electron Microsc. 47 (1998) p. 561.
G.V. Spivak, O.P. Pavlyuchenko, and V.I. Petrov, Bull. Acad. Sci. USSR 30 (1966) p. 822.
A.M. Minor, E.T. Lilleodden, E.A. Stach, and J.W. Morris, J. Mater. Res. 19 (2004) p. 176.
X.L. Tan, H. He, and J.K. Shang, J. Mater. Res. 20 (2005) p. 1641.
Linac Coherent Light Source (LCSC) home page, www-ssrl.slac.stanford.edu/lcls/ (accessed July 2006).
“TESLA Technical Design Report, Part V: The X-Ray Free Electron Laser,” edited by G. Materlik and Th. Tschentscher, http://tesla.desy.de/new_pages/TDR_CD/PartV/fel.html (accessed July 2006).
N. Bloembergen, Rev. Mod. Phys. 71 (1999) p. S283.
A. Rousse, C. Rischel, and J.C. Gauthier, Rev. Mod. Phys. 73 (2001) p. 17.
C. Bressler and M. Chergui, Chem. Rev. 104 (2004) p. 1781.
C. Rischel, A. Rousse, I. Uschmann, P.A. Albouy, J.P. Geindre, P. Audebert, J.C. Gauthier, E. Forster, J.L. Martin, and A. Antonetti, Nature 390 (1997) p. 490.
C.W. Siders, A. Cavalleri, K. Sokolowski-Tinten, C. Toth, T. Guo, M. Kammler, M.H. von Hoegen, K.R. Wilson, D. von der Linde, and C.P.J. Barty, Science 286 (1999) p. 1340.
C. Rose-Petruck, R. Jimenez, T. Guo, A. Cavalleri, C.W. Siders, F. Raksi, J.A. Squier, B.C. Walker, K.R. Wilson, and C.P.J. Barty, Nature 398 (1999) p. 310.
A. Rousse, C. Rischel, S. Fourmaux, I. Uschmann, S. Sebban, G. Grillon, P. Balcou, E. Foster, J.P. Geindre, P. Audebert, J.C. Gauthier, and D. Hulin, Nature 410 (2001) p. 65.
K. Sokolowski-Tinten, C. Blome, C. Dietrich, A. Tarasevitch, M.H. von Hoegen, D. von der Linde, A. Cavalleri, J. Squier, and M. Kammler, Phys. Rev. Lett. 87 225701 (2001).
A. Cavalleri, C. Toth, C.W. Siders, J.A. Squier, F. Raksi, P. Forget, and J.C. Kieffer, Phys. Rev. Lett. 87 237401 (2001).
T. Feurer, A. Morak, I. Uschmann, C. Ziener, H. Schwoerer, C. Reich, P. Gibbon, E. Forster, R. Sauerbrey, K. Ortner, and C.R. Becker, Phys. Rev. E 65 016412 (2002).
K. Sokolowski-Tinten, C. Blome, J. Blums, A. Cavalleri, C. Dietrich, A. Tarasevitch, I. Uschmann, E. Forster, M. Kammler, M. Hornvon-Hoegen, and D. von der Linde, Nature 422 (2003) p. 287.
A. Rousse, P. Audebert, J.P. Geindre, F. Fallies, J.C. Gauthier, A. Mysyrowicz, G. Grillon, and A. Antonetti, Phys. Rev. E 50 (1994) p. 2200.
T. Tajima and J.M. Dawson, Phys. Rev. Lett. 43 (1979) p. 267.
I. Kostyukov, S. Kiselev, and A. Pukhov, Phys. Plasmas 10 (2003) p. 4818.
A. Pukhov and J. Meyer-ter-Vehn, Appl. Phys. B 74 (2002) p. 355.
A. Rousse, K.T. Phuoc, R. Shah, A. Pukhov, E. Lefebvre, V. Malka, S. Kiselev, F. Burgy, J.P. Rousseau, D. Umstadter, and D. Hulin, Phys. Rev. Lett. 93 135005 (2004).
K.T. Phuoc, F. Burgy, J.P. Rousseau, V. Malka, A. Rousse, R. Shah, D. Umstadter, A. Pukhov, and S. Kiselev, Phys. Plasmas 12 023101 (2005).
Y.-J. Chen, L.R. Bertolini, G.J. Caporaso, F.W. Chambers, E.G. Cook, S. Falabella, F.J. Goldin, G. Guethlein, D.D.-M. Ho, J.F. McCarrick, S.D. Nelson, R. Neurath, A.C. Paul, P.A. Pincosy, B.R. Poole, R.A. Richardson, S. Sampayan, L.-F. Wang, and J.A. Watson, presented at the XXI Intl. Linac Conf. (Gyeongju, Korea, August 19–23, 2002).
S.P.D. Mangles, C.D. Murphy, Z. Najmudin, A.G.R. Thomas, J.L. Collier, A.E. Dangor, E.J. Divall, P.S. Foster, J.G. Gallacher, C.J. Hooker, D.A. Jaroszynski, A.J. Langley, W.B. Mori, P.A. Norreys, F.S. Tsung, R. Viskup, B.R. Walton, and K. Krushelnick, Nature 431 (2004) p. 535.
C.G.R. Geddes, C. Toth, J. van Tilborg, E. Esarey, C.B. Schroeder, D. Bruhwiler, C. Nieter, J. Cary, and W.P. Leemans, Nature 431 (2004) p. 538.
J. Faure, Y. Glinec, A. Pukhov, S. Kiselev, S. Gordienko, E. Lefebvre, J.P. Rousseau, F. Burgy, and V. Malka, Nature 431 (2004) p. 541.
T. LaGrange, M.A. Armstrong, K.R. Boyden, C.G. Brown, N.D. Browning, G.H. Campbell, J.D. Colvin, W.J. DeHope, A.M. Frank, D.J. Gibson, F.V. Hartemann, J.S. Kim, W.E. King, B.J. Pyke, B.W. Reed, M.D. Shirk, R.M. Shuttlesworth, B.C. Stuart, and B.R. Torralva, “Single Shot Dynamic Transmission Electron Microscopy,” Appl. Phys. Lett. 89 044105 (2006).
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King, W.E., Armstrong, M., Malka, V. et al. Ultrafast Imaging of Materials: Exploring the Gap of Space and Time. MRS Bulletin 31, 614–619 (2006). https://doi.org/10.1557/mrs2006.158
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DOI: https://doi.org/10.1557/mrs2006.158