Abstract
Identifying constituent atoms in materials is the ultimate goal for all analytical techniques. Here, we describe the successful achievement of single atom spectroscopy in nanostructured carbon-based materials using a scanning transmission electron microscope equipped with electron energy-loss spectroscopy. The chemical analyis of individual metallofullerene molecules can be successfully performed without massive beam damage. Atom-by-atom spectroscopy of the edge carbon atoms in single layer graphene is also discussed.
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Acknowledgements
This work is supported by the JST-CREST program and grant-in-aid from MEXT (19054017). The work has been done with the collaboration of Drs. Masahiro Koshino, Yoshiko Niimi, Toshiya Okazaki, and Yoko Iizumi.
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Suenaga, K., Kobayashi, H. & Koshino, M. Single atom imaging and spectroscopy in nanostructured carbon materials. MRS Bulletin 37, 36–38 (2012). https://doi.org/10.1557/mrs.2011.339
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DOI: https://doi.org/10.1557/mrs.2011.339