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Preparation and electrical conductivity of graphitic carbon-infused copper alloys

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Abstract

By electron-beam (e-beam) melting, we prepared 0.4 wt% carbon-infused copper (CuCv4), and a copper control without carbon addition (CuCvO). Scanning electron microscopy and helium ion microscopy (HIM) were performed on the as-solidified surface, fracture surface, and ion-polished surface of the CuCv4 sample. The results revealed that graphitic carbon flakes cover the as-solidified surface, and carbon nanoparticles and clusters exist in the fracture and ion-polished surfaces. HIM on the ion-polished surface revealed a unique ripple-shaped feature, which is possibly associated with the infusion of carbon nanoribbons in the copper matrix. The bulk densities were measured to be 8.86 and 8.53 g/cm3, which correspond to relative densities of 98.9% and 96.4% for the CuCvO and CuCv4 samples, respectively. In addition, apparent electrical conductivities were measured to be 56.9 and 57.5 MS/m, respectively, for the e-beam melted CuCvO and CuCv4 samples. These values correspond to true electrical conductivities of 100.5% IACS (International Annealed Copper Standard) and 107.4% IACS after correction for the porosity. Our results reveal remarkable promise of using covetic copper for the next generation conductors in energy applications from microelectronic devices to high-power transmission cables.

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Acknowledgment

The authors would like to thank Ms. J. Wang, Dr. J. Wen, Mr. B. L. Fisher, and Dr. R. E. Koritala in the Nanoscience and Technology Division, Ms. S. J. Lopykinski and Dr. D. G. Graczyk in the Chemical and Fuel Cycle Technology Division at Argonne National Laboratory for their technical assistance and discussion. This work was supported by the US Department of Energy (DOE), Energy Efficiency and Renewable Energy, Advanced Manufacturing Office, under Contract No. DE-AC02-06CH11357. Use of the Center for Nanoscale Materials, an Office of Science user facility, was supported by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. Helium ion microscopy was conducted at the Center for Nanophase Materials Sciences at Oak Ridge National Laboratory, which is a DOE Office of Science User Facility. The submitted manuscript has been created by UChicago Argonne, LLC, Operator of Argonne National Laboratory (“Argonne”). Argonne, a US Department of Energy Office of Science laboratory, is operated under Contract No. DE-AC02-06CH11357. The US Government retains for itself, and others acting on its behalf, a paid-up nonexclusive, irrevocable worldwide license in said article to reproduce, prepare derivative works, distribute copies to the public, and perform publicly and display publicly, by or on behalf of the Government.

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Authors and Affiliations

  1. Applied Materials Division, Argonne National Laboratory, Argonne, IL, 60439, USA

    B. Ma, U. Balachandran, S. E. Dorris & T. H. Lee

  2. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA

    A. J. Rondinone

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  1. B. Ma
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  2. U. Balachandran
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  3. S. E. Dorris
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  4. T. H. Lee
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  5. A. J. Rondinone
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Correspondence to B. Ma.

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Ma, B., Balachandran, U., Dorris, S.E. et al. Preparation and electrical conductivity of graphitic carbon-infused copper alloys. MRS Communications 9, 137–143 (2019). https://doi.org/10.1557/mrc.2019.12

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