Abstract
In this article, single-phase CuIn(SxSe1-x)2 thin films with different x have been prepared using a new two-step method consisting of partly selenizing Cu–In precursors in Se ambient, and then exposing the partly selenized films to H2S/Ar under different conditions. The x-ray diffraction indicated that the CuIn(SxSe1-x)2 films exhibited the homogeneous chalcopyrite structure. With the increase of the sulfurization temperature from 425 to 525 °C, x increases from 0 to 1, Eg increases from 0.95 to 1.42 eV, the Raman shift of the A1[Se–Se] mode increases from 173 to 197 cm−1, and the resistivity increases from 101 to 103 Ω.cm.
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ACKNOWLEDGMENTS
This work was supported by National Basic Research Program of China (973 Program)-2012CB922001 and the Fundamental Research Funds for the Central Universities (WK2060140005).
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Yan, F., Liu, W., Jiang, G. et al. Effects of different sulfurization conditions on the characterization of CuIn(SxSe1−x)2 thin films. Journal of Materials Research 27, 1112–1116 (2012). https://doi.org/10.1557/jmr.2012.64
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DOI: https://doi.org/10.1557/jmr.2012.64