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doi: 10.1557/jmr.2012.162, Published by Cambridge University Press, 8 June 2012.
In the article by Regoutz et al.,1 a (1026) reflection is indicated throughout the text.
The correct reflection is (1026) in all instances.
The publisher regrets the error.
Reference
A. Regoutz, K.H.L Zhang, R.G. Egdell, D. Wermeille, and R.A. Cowley: A study of (111) oriented epitaxial thin films of In2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction. J. Mater. Res. 27, 2257–2264 (2012) doi: 10.1557/jmr.2012.162.
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Regoutz, A., Zhang, K.H.L., Egdell, R.G. et al. A study of (111) oriented epitaxial thin films of In2O3 on cubic Y-doped ZrO2 by synchrotron based x-ray diffraction–ERRATUM. Journal of Materials Research 27, 2447 (2012). https://doi.org/10.1557/jmr.2012.270
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DOI: https://doi.org/10.1557/jmr.2012.270