Abstract
The early stages of surface oxidation of biaxially textured Ni-W tapes were studied using thermodynamic calculations along with experimental tape oxidation at low P(O2). Tape phase and chemical composition, surface morphology, and roughness were examined using x-ray diffraction (XRD), energy-dispersive x-ray analysis (EDX), secondary ion mass spectroscopy (SIMS), x-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). For a Ni0.95W0.05 alloy tape, the precise position of the tape oxidation line in P(O2)-T coordinates was established. This line includes a break at T ≈ 650 °C that originates from the change of the W oxidation mechanism from internal oxidation to oxidation on a free surface accompanied by segregation of the alloy components in the tape near-surface region. The surface roughness of a polished tape increased drastically during internal oxidation of W; further tape oxidation did not affect the integral roughness parameters, but introduced numerous small (~100 nm) features on the tape surface comprising NiO precipitates.
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Blednov, A.V., Gorbenko, O.Y., Rodionov, D.P. et al. Revealing the mechanism of the early stages of Ni−W RABiTS oxidation. Journal of Materials Research 25, 2362–2370 (2010). https://doi.org/10.1557/jmr.2010.0312
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DOI: https://doi.org/10.1557/jmr.2010.0312