Abstract
Details of the elastic–plastic transitions in crystalline compound semiconductors have been examined using spherical indentation. Two cubic (InP and GaAs) and two hexagonally structured semiconductors (ZnO and GaN) have been studied. A series of indentations have been made in each material at a number of different loads. The resulting load–penetration curves exhibited one or more discontinuities on loading (so called pop-in events). The load at which the initial pop-in event occurred has been measured along with the corresponding indenter extension. The elastic and elastic–plastic response of each material to spherical indentation has been calculated and compared with the experiment. By taking the difference between the elastic and elastic–plastic penetration depths, it has been found that the pop-in extension at each load could be predicted for each material. The detailed deformation behavior of each of the materials during indentation has also been discussed.
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Bradby, J.E., Williams, J.S. & Swain, M.V. Pop-in events induced by spherical indentation in compound semiconductors. Journal of Materials Research 19, 380–386 (2004). https://doi.org/10.1557/jmr.2004.19.1.380
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DOI: https://doi.org/10.1557/jmr.2004.19.1.380