Abstract
High resolution electron microscopy and electron energy-loss spectrometry were used to investigate both atomic and electronic structures of grain boundaries in diamond thin films grown by chemical vapor deposition The atomic structures of {112}Σ3 and {114}∑9 <110> tilt boundaries in diamond show different features from those in other diamond structure semiconductors. The electron energy-loss spectra recorded from the grain boundary regions show extra intensity near the energy-loss corresponding to carbon Is-to-π* transition, as compared to the spectra recorded from neighboring crystalline regions. This gives the evidence that the dangling bonds are not fully reconstructed along <110> direction in the boundary structure. Atomic models are constructed for these boundaries with the presence of non-tetracoordinated atoms The stability of the boundary structure is explained by the π-like bonding between the nontetracoordinated atoms.
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Acknowledgments
The present research is partly supported by the Foundation for Promotion of Material Science and Technology of Japan. The first author also acknowledges the financial supports from JSPS Research Fellowships for Young Scientists and the Subsidy for Scientific Research of the Ministry of Education of Japan.
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Zhang, Y., Ichinose, H., Ishida, Y. et al. Atomic and Electronic Structures of Grain Boundary in Chemical Vapor Deposited Diamond thin Film. MRS Online Proceedings Library 416, 355–360 (1995). https://doi.org/10.1557/PROC-416-355
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DOI: https://doi.org/10.1557/PROC-416-355