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Optical and X-Ray Diffraction Characterization of MBE-Grown InGaAs, InAlAs and InGaAIAs on InP

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Abstract

A variety of In1-xGaxAs, In1-yAlyAs and In1-x-yGaxAlyAs films have been grown on InP by molecular beam epitaxy. A comprehensive characterization was performed using Raman scattering, photoluminescence (PL), Fourier transform infrared (FTIR) spectroscopy and double crystal X-ray diffraction on these ternary and quaternary heterostructures with different compositions and growth conditions. The lattice matched and mismatched structures are studied. Our analyses show that the interface mismatch exerts an important influence on the optical properties of these heterostructures, and conversely that Raman, PL and FTIR can be used to probe the interface mismatch nondestructively.

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References

  1. K. Y. Cheng, A. Y. Cho and W. R. Wagner, J. Appl. Phys. 52, 6328 (1981).

    Article  CAS  Google Scholar 

  2. S. Emura, S-I. Gonda, Y. Matsui and H. Hayashi, Phys. Rev. 38, 3280 (1988).

    Article  CAS  Google Scholar 

  3. Z. C. Feng, A. A. Allerman, P. A. Barnes and S. Perkowitz, Appl. Phys. Lett. 60, 1848 (1992).

    Article  CAS  Google Scholar 

  4. M. H. Brodsky and G. Lucovsky, Phys. Rev. Lett. 21, 990 (1968).

    Article  CAS  Google Scholar 

  5. R. Houdrè, L. Pavesi, M. Galihanou and M. Ilegems, in 21st Intern. Conf. Phys. Semicond., ed. by P. Jiang and H.-Z. Zheng, World Scientific Publishing, Singapore, 1992, Vol. 1, p. 161.

    Google Scholar 

  6. G. L. Davies, T. Kerr, C. G. Tuppen, B. Wakefield and D. A. Andrews, J. Vac. Sci. Technol. B2, 219 (1984).

    Article  Google Scholar 

  7. Y. C. Wong, C. Kan and Z. C. Feng, internal research report, National University of Singapore, Department of Physics, 1993-1994.

    Google Scholar 

  8. H. Kawamura, R. Tsu and L. Esaki, Phys. Rev. Lett. 29, 1397 (1972).

    Article  CAS  Google Scholar 

Download references

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Authors and Affiliations

  1. Department of Physics, National University of Singapore, S0511, Singapore

    Z. C. Feng

  2. Centre for Optoelectronics, Department of Electrical Engineering, National University of Singapore, S0511, Singapore

    S. J. Chua, A. Raman & N. N. Lim

Authors
  1. Z. C. Feng
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  2. S. J. Chua
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  3. A. Raman
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  4. N. N. Lim
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Feng, Z.C., Chua, S.J., Raman, A. et al. Optical and X-Ray Diffraction Characterization of MBE-Grown InGaAs, InAlAs and InGaAIAs on InP. MRS Online Proceedings Library 340, 53–58 (1994). https://doi.org/10.1557/PROC-340-53

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  • DOI: https://doi.org/10.1557/PROC-340-53

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