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Orientation transformation of Pb grains in 5Sn–95Pb/ 63Sn–37Pb composite flip-chip solder joints during electromigration test

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Abstract

Microstructural evolution occurred in 5Sn–95Pb/63Sn–37Pb composite flip-chip solder bump during electromigration. Scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD) observations for 5Sn–95Pb/63Sn–37Pb composite flip-chip solder joints subjected to 5 kA/cm2 current stressing at 150 °C revealed a gradual orientation transformation of Pb grains from random textures toward (101) grains. We proposed that the combination of reducing the surface energy of Pb grain boundaries and resistance of the entire polycrystalline system are the driving force for the orientation transformation of Pb grains during an electromigration test.

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Acknowledgments

This work was sponsored by the National Science Council of Republic of China (Taiwan) under NSC(94-2216-E-006-014) and by the National Cheng Kung University (NCKU) project of Promoting Academic Excellence & Developing World Class Research Center: D96-2700.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, and Frontier Material and Micro/Nano Science and Technology Center, National Cheng Kung University, Tainan, 701, Taiwan

    Ying-Ta Chiu & Kwang-Lung Lin

  2. Central Labs, Advanced Semiconductor Engineering, Inc., Kaohsiung, 811, Taiwan

    Yi-Shao Lai

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  1. Ying-Ta Chiu
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  2. Kwang-Lung Lin
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  3. Yi-Shao Lai
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Correspondence to Ying-Ta Chiu.

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Chiu, YT., Lin, KL. & Lai, YS. Orientation transformation of Pb grains in 5Sn–95Pb/ 63Sn–37Pb composite flip-chip solder joints during electromigration test. Journal of Materials Research 23, 1877–1881 (2008). https://doi.org/10.1557/JMR.2008.0227

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  • DOI: https://doi.org/10.1557/JMR.2008.0227

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