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Determination of the anisotropic optical properties for perfluorinated vanadyl phthalocyanine thin films

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Abstract

Thin films of perfluorinated vanadyl phthalocyanine F16PcVO were prepared by physical vapor deposition in high vacuum on KBr and fused silica substrates. The absorption spectra in the visible region show that the films on different substrates have different structure. The optical constants for F16PcVO films were obtained in the spectral range of 0.7–4.5 eV from the simulation of ellipsometry spectra with an anisotropic uniaxial model. From the difference between the in-plane and out-of-plane components of the extinction coefficient the average tilt angle of the F16PcVO molecular planes with respect to the substrate plane was found to be 56° for fused silica substrates and between 0° and 3° for KBr substrates.

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Authors and Affiliations

  1. Semiconductor Physics, University of Technology Chemnitz, D-09107, Chemnitz, Germany

    O. D. Gordan & M. Friedrich

  2. Physical Chemistry 1, Institute of Pure and Applied Chemistry, Faculty of Science, University of Oldenburg, D-26111, Oldenburg, Germany

    W. Michaelis

  3. Institute of Solid State Physics, University of Bremen, D-28334, Bremen, Germany

    R. Kröger

  4. Physics Institute, University of Technology Chemnitz, D-09107, Chemnitz, Germany

    T. Kampen

  5. Physical Chemistry 1, Institute of Pure and Applied Chemistry, Faculty of Science, University of Oldenburg, D-26111, Oldenburg, Germany

    D. Schlettwein

  6. Semiconductor Physics, University of Technology Chemnitz, D-09107, Chemnitz, Germany

    D. R. T. Zahn

Authors
  1. O. D. Gordan
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  2. M. Friedrich
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  3. W. Michaelis
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  4. R. Kröger
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  5. T. Kampen
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  6. D. Schlettwein
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  7. D. R. T. Zahn
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Correspondence to O. D. Gordan.

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Gordan, O.D., Friedrich, M., Michaelis, W. et al. Determination of the anisotropic optical properties for perfluorinated vanadyl phthalocyanine thin films. Journal of Materials Research 19, 2008–2013 (2004). https://doi.org/10.1557/JMR.2004.0264

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  • DOI: https://doi.org/10.1557/JMR.2004.0264

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