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Morphology and electrical transport in pentacene films on silylated oxide surfaces

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Abstract

A study comparing the morphology and electrical transport properties of pentacene films on underlayers of different self-assembled monolayers (SAMs) is presented. The SAMs studied as underlayers were phenyltrichlorosilane, n-octadecyltrichlorosilane, and t-butyldiphenylchlorosilane. Pentacene thin films were grown by vacuum sublimation on SiO2 surfaces treated with self-assembled monolayers. During deposition, substrates were held at a temperature of 70 °C. The morphologies of the films at different stages of deposition were studied by atomic force microscopy, and the transport properties of the films were characterized by I-V measurements in a simple field-effect transistor (FET) structure. The SAM underlayers strongly influence the film morphology in the first few molecular layers and hence significantly impact the electrical transport in the resulting FETs.

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Authors and Affiliations

  1. Center for Thin Film Devices, Department of Electrical Engineering, Pennsylvania State University, 16802, University Park, Pennsylvania, USA

    Karthik Shankar & Thomas N. Jackson

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  1. Karthik Shankar
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  2. Thomas N. Jackson
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Correspondence to Karthik Shankar.

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Shankar, K., Jackson, T.N. Morphology and electrical transport in pentacene films on silylated oxide surfaces. Journal of Materials Research 19, 2003–2007 (2004). https://doi.org/10.1557/JMR.2004.0255

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  • DOI: https://doi.org/10.1557/JMR.2004.0255

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