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X-ray photoelectron spectroscopy of electrodeposited cadmium mercury telluride thin films and their native surface oxides

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Abstract

Electrodeposited thin films of CdTe and CdxHg1−xTe with 1 − x = 0 and approximately 0.1 were characterized by x-ray photoelectron spectroscopy. The composition of the bulk and the thickness and composition of the native surface oxide before and after Ar+ ion sputtering were determined. A surface oxide layer 20-Å thick constituted mainly of alloyed TeO2 and CdO was found over a nearly stochiometric bulk. Chemical diffusion of Hg, Cd, and Te to the surface was observed. Hg appears to inhibit oxidation of the telluride, mainly of Te. Ar sputtering removed undesirable oxides and impurities off the films.

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Authors and Affiliations

  1. Departamento de Física Aplicada, Facultad de Ciencias, Universidad Autónoma de Madrid, 28049, Madrid, Spain

    J. Ramiro, L. Galán & E. García Camarero

  2. Instituto de Ciencia de Materiales, CSIC, Campus de la Universidad Autónoma de Madrid, 28049, Madrid, Spain

    I. Montero

  3. Dépt. Physique B.P.S./15, L.P.S.C.M. Faculté des Sciences Semlalia, 40000, Marrakech, Morocco

    Y. Laaziz

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  1. J. Ramiro
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  2. L. Galán
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  3. E. García Camarero
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  4. I. Montero
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  5. Y. Laaziz
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Ramiro, J., Galán, L., Camarero, E.G. et al. X-ray photoelectron spectroscopy of electrodeposited cadmium mercury telluride thin films and their native surface oxides. Journal of Materials Research 16, 1942–1952 (2001). https://doi.org/10.1557/JMR.2001.0266

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  • DOI: https://doi.org/10.1557/JMR.2001.0266

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