Skip to main content
SpringerLink
Log in

Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers

  • Journal of Materials Research
  • Published:
Journal of Materials Research Aims and scope Submit manuscript

Abstract

The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers. Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. A. A. Saleh, V. Shutthanandan, and R. J. Smith, Phys. Rev. B 49, 4908 (1994).

    Article  CAS  Google Scholar 

  2. R. Banerjee, R. Ahuja, and H. L. Fraser, Phys. Rev. Lett. 76, 3778 (1996).

    Article  CAS  Google Scholar 

  3. R. Ahuja and H. L. Fraser, J. Electr. Mater. 23, 1027 (1994).

    Article  CAS  Google Scholar 

  4. R. Ahuja and H. L. Fraser, J. Metals 46, 35 (1994).

    CAS  Google Scholar 

  5. A. F. Jankowski and M. A. Wall, NanoStruct. Mater. 7, 89 (1996).

    Article  CAS  Google Scholar 

  6. J. Chaudhuri, S. M. Alyan, and A. F. Jankowski, in Thin Films: Stresses and Mechanical Properties IV, edited by P. H. Townsend, T.P. Weihs, J. E. Sanchez, Jr., and P. Børgesen (Mater. Res. Soc. Symp. Proc. 308, Pittsburgh, PA, 1993), p. 707.

    Google Scholar 

  7. D. van Heerden, D. Josell, and D. Shechtman, Acta Mater. 44, 297 (1996).

    Article  Google Scholar 

  8. D. Shechtman, D. van Heerden, and D. Josell, Mater. Lett. 20, 329 (1994).

    Article  CAS  Google Scholar 

  9. D. Josell, D. Shechtman, and D. van Heerden, Mater. Lett. 22, 275 (1995).

    Article  CAS  Google Scholar 

  10. O. Jin and B. X. Liu, Mater. Lett. 27, 165 (1996).

    Article  CAS  Google Scholar 

  11. T. Tepper, D. Shechtman, D. van Heerden, and D. Josell, Mater. Lett. 35, 100 (1998).

    Article  CAS  Google Scholar 

  12. G. J. van der Kolk, A. R. Miedema, and A. K. Niessen, J. Less-Common Met. 145, 1 (1988).

    Article  Google Scholar 

  13. O. L. Krivanek, A. J. Gubbens, N. Dellby, and C. E. Meyer, Microsc. Microanal. Microstruct. 3, 187 (1992).

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. National Institute of Standards and Technology, Metallurgy Division, Gaithersburg, Maryland, 20899, USA

    J. Bonevich

  2. Department of Materials Science, The Johns Hopkins University, Baltimore, Maryland, 21218, USA

    D. van Heerden

  3. National Institute of Standards and Technology, Metallurgy Division, Gaithersburg, Maryland, 20899, USA

    D. Josell

Authors
  1. J. Bonevich
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. D. van Heerden
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. D. Josell
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Bonevich, J., van Heerden, D. & Josell, D. Face-centered-cubic titanium: An artifact in titanium/aluminum multilayers. Journal of Materials Research 14, 1977–1981 (1999). https://doi.org/10.1557/JMR.1999.0266

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/JMR.1999.0266

Search

Navigation