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Post-annealing induced defects and their influences on Bi2Sr2CaCu2Oy superconducting thin films

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Abstract

Defects in Bi2Sr2Can-1CunOy superconducting thin films annealed in an oxygen atmosphere are examined by high-resolution electron microscopy (HREM). In addition to the majority 2212 (n = 2) phase, subsequent slabs of other homologous phases with n values up to n = 10 are found intergrown in the films. Large-angle tilt grain boundaries and various secondary phases such as CuO, Sr-Cu-O oxides are formed in the films. The occurrence of these defects is attributed to an inhomogeneous Sr, Ca, and Cu distribution induced by the post-annealing. Superconducting transition temperature (Tc) is increased by the annealing under suitable conditions.

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Authors and Affiliations

  1. Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, P.O. Box 2724, 100080, Beijing, People’s Republic of China

    Xiao Feng Zhang

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Zhang, X.F. Post-annealing induced defects and their influences on Bi2Sr2CaCu2Oy superconducting thin films. Journal of Materials Research 10, 1872–1877 (1995). https://doi.org/10.1557/JMR.1995.1872

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  • DOI: https://doi.org/10.1557/JMR.1995.1872

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