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Ion beam mixing study on Cu/Al2O3 bilayer samples using Rutherford backscattering spectrometry

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Abstract

Cu/Al2O3 bilayer samples were produced by vapor deposition and irradiated successively with 150 keV Ar ions up to a dose of 500 dpa. Ion beam mixing effects were studied by 2 Me V He+ Rutherford backscattering spectroscopy (RBS). Concentration depth profiles show the mixing of Cu, Al, and O atoms in the sample. Because of the low mixing efficiency found in this study, Al2O3-dispersion strengthened Cu alloys seem to be good candidates as structural materials in fusion reactors.

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Balogh, A.G., Macht, MP. & Naundorf, V. Ion beam mixing study on Cu/Al2O3 bilayer samples using Rutherford backscattering spectrometry. Journal of Materials Research 9, 406–409 (1994). https://doi.org/10.1557/JMR.1994.0406

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  • DOI: https://doi.org/10.1557/JMR.1994.0406

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