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Relationship between characteristics of modulation peaks and modulation wavelength, average composition, and interdiffusion tendency of multilayers

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Abstract

It was found that the modulation wavelength and average composition of multilayers are related to the position, intensity, and diffraction order of x-ray modulation peaks for multilayers. The relation between the characteristics of the modulation peaks in different as-deposited multilayers and their interdiffusion capability is also discussed.

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References

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Authors and Affiliations

  1. Institute of Physics, Academia Sinica, 100080, Beijing, People’s Republic of China

    H. Y. Bai, W. H. Wang, Y. Zhang & H. Chen

  2. Institute of Physics, Academia Sinica, 100080, Beijing, People’s Republic of China

    W. K. Wang

  3. International Center for Materials, Academia Sinica, 110015, Shenyang, People’s Republic of China

    W. K. Wang

Authors
  1. H. Y. Bai
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  2. W. H. Wang
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  3. Y. Zhang
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  4. H. Chen
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  5. W. K. Wang
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Bai, H.Y., Wang, W.H., Zhang, Y. et al. Relationship between characteristics of modulation peaks and modulation wavelength, average composition, and interdiffusion tendency of multilayers. Journal of Materials Research 7, 1423–1426 (1992). https://doi.org/10.1557/JMR.1992.1423

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  • DOI: https://doi.org/10.1557/JMR.1992.1423

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