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Influence of the noise strength in a novel tristate electronic circuit and its microcontroller-based experimental powered by multifrequency signals

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Abstract

The present study considers an electronic circuit for modeling a stochastic tristate system. The circuit shows the ghost stochastic resonance (GSR) and ghost stochastic antiresonance (GSAR) through the system dynamical properties. We investigated the dynamics occurred in the circuit composed of two AC generator and one noise generator. Our attention is focused on the noise effect which takes into account the circuit’s temperature. The circuit shows the changes according to four control parameters: the applied voltage amplitude, the frequency, the circuit damping and the multistability parameters (resistors). The multistability impact is the major aim explored in this work. Surprisingly, the system encounters a novel aspect which is simply the fact that three resistors are joined together to generate different sorts of multistability characteristics, starting from a tristable potential shape to a monostable potential shape and ending with a catastrophic potential shape. The dynamic of the system is studied numerically and by Pspice Simulation. The Pspice estimates match with numerical simulations. Firstly, we start by studying numerically the multistability effects as well as the damping term effects on the Mean First Passage Time (MFPT). Then, we study numerically the effect of multistability on the GSR and GSAR. Response curves obtained illustrating the appearance of GSR and GSAR in the system are obtained through the sine and the cosine Fourier component denoted \(Q(\omega )\). Remarkably, the variation of resistances greatly influences the occurrence of GSR and GSAR in the system. A low-cost microcontroller-based implementation for digital engineering applications is presented to confirm the feasibility of the circuit.

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Data Availability Statement

This manuscript has no associated data or the data will not be deposited. [Authors’ comment: There are no associated data available.]

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Authors and Affiliations

  1. Laboratory of Mechanics, Materials and Structures, Department of Physics, Faculty of Science, University of Yaounde I, P.O. Box 812, Yaoundé, Cameroon

    M. Djolieu Funaye, A. F. Moyo Tala, Servet. Kamdem Tchiedjo & G. Djuidjé Kenmoé

  2. Department of Technology, Langston University, Langston, OK, 73050, USA

    F. Fondjo Fotou

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  1. M. Djolieu Funaye
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Correspondence to M. Djolieu Funaye.

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Djolieu Funaye, M., Moyo Tala, A.F., Kamdem Tchiedjo, S. et al. Influence of the noise strength in a novel tristate electronic circuit and its microcontroller-based experimental powered by multifrequency signals. Eur. Phys. J. Plus 138, 627 (2023). https://doi.org/10.1140/epjp/s13360-023-04224-6

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