Abstract.
We have used measurements of the absolute intensity of diffuse X-ray scattering to extract the interfacial tension of a buried polymer/polymer interface. Diffuse scattering was excited by an X-ray standing wave whose phase was adjusted to have a high intensity at the polymer/polymer interface and simultaneously a node at the polymer/air interface. This method permits the capillary-wave-induced roughness of the interface, and hence the interfacial tension, to be measured independently of the polymer/polymer interdiffusion.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
E. Helfand, Y. Tagami, J. Chem. Phys. 56, 3592 (1972).
M. Fernandez,, Polymer 29, 1923 (1988).
K. Shull, A. Mayes, T.P. Russell, Macromolecules 26, 3929 (1993).
B.R. McClain, M. Yoon, J.D.Lister, S.G.J. Mochrie, Eur. Phys. J. B 10, 45 (1999).
M. Sferrazza, C. Xiao, R.A.L. Jones, Phys. Rev. Lett. 78, 3693 (1997).
S. Huttenbach, M. Stamm, G. Reiter, M. Foster, Langmuir 7, 2438 (1991).
M. Sanyal, S.K. Sinha, K.G. Huang, B.M. Ocko, Phy. Rev. Lett. 66, 628 (1991).
L. Lurio, H. Kim, A. Ruhm, J. Basu, J. Lal, S.K. Sinha, S. Mochrie, Macromolecules 36, 5703 (2003).
R.S. Guico, S. Narayanan, J. Wang, K.R. Shull, Macromolecules 37, 8357 (2004).
H. Kim, A. Ruhm, L.B. Lurio, J.K. Basu, J. Lal, S.K. Sinha, D. Lumma, S.G.J. Mochrie, Phys. Rev. Lett. 90, 68302 (2003).
V. Holy, J. Kubena, I. Ohlidal, K. Lischka, W. Plotz, Phys. Rev. B 47, 15896 (1993).
J. Daillant, A. Gibaud, X-Ray and Neutron Reflectivity and Scattering (Springer, Berlin, 1999).
B. Guckenbiehl, M. Stamm, T. Springer, Physica B 198, 127 (1994).
M. Sferrazza, C. Xiao, D.G. Bucknall, R.A.L. Jones, J. Phys. Condens. Matter 13, 10269 (2001).
M. Sferrazza, C. Xiao, R.A.L. Jones, Philos. Mag. Lett. 80, 561 (2000).
S. Puri, K. Binder, Phys. Rev. B 17, 9375 (1991).
M. Tolan, X-ray scattering from soft matter thin films, in Springer Tracts Mod. Phys., Vol. 148 (Springer, 1999).
F. Brunder, Macromolecules 24, 20 (1991).
These retardation effects result due to the finite time required for the electric field transmitted from a fluctuating dipole to reach a neighboring atom and then return. When the distance the field travels is comparable to the correlation time of the fluctuations, retardation takes effect. This decreases the power law of the dispersion interaction by one power of the thickness. Approximate methods to estimate the magnitude of Van der Waals forces in the retarded regime are given by Israelachvili and by Hunter.
J. Israelachvili, Intermolecular and Surface Forces (Academic Press, 1991) p. 184.
R.B. Hunter, Introduction of Colloidal Science, Vol. 1 (Clarendon Press, Oxford, 1987) p. 190.
A. Braslau, P.S. Pershan, G. Swislow, B.M. Ocko, J.Als-Nielsen, Phys. Rev. A 38, 2457 (1988).
W. Zhao,, Physica B 173, 43 (1991).
Xuesong Hu, Jyotsana Lal, Xuesong Jiao, L.B. Lurio, Suresh Narayanan, Proceedings of the International School of Physics ‘‘Enrico Fermi’’, The Physics of Complex Systems (New Advances and Perspectives), Course CLV, edited by F. Mallamace, H.E. Stanley (SIF, IOS Press, 2004) pp. 549-555.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Hu, X., Jiao, X., Narayanan, S. et al. Resonantly enhanced off-specular X-ray scattering from polymer/polymer interfaces⋆. Eur. Phys. J. E 17, 353–359 (2005). https://doi.org/10.1140/epje/i2004-10147-4
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1140/epje/i2004-10147-4