Abstract
The present work focuses on investigation of laser-induced third-order optical nonlinearity in molybdenum trioxide (\(\hbox {MoO}_{\mathrm {3}}\))-doped vanadium pentaoxide (\(\hbox {V}_{\mathrm {2}} \hbox {O}_{\mathrm {5}}\)) thin films. \( \hbox {MoO}_{\mathrm {3}}\) has been doped in \( \hbox {V}_{\mathrm {2}} \hbox {O}_{\mathrm {5}}\) at different concentrations and thin films (\(\hbox {MoO}_{\mathrm {3}} \!:\! \hbox {V}_{\mathrm {2}} \hbox {O}_{\mathrm {5}}\)) with varying thickness have been deposited on glass substrate by standard thermal evaporation method. X-ray diffraction studies show that deposited films have orthorhombic structure and the lattice parameters change with amount of doping as well as with the thickness of the film. A Nd:YAG-pulsed laser beam having wavelength \(\sim \) 532nm has been used as excitation source. Intensity-dependent absorption coefficient (\(\upbeta \)), nonlinear refractive index (\(n_{2}\)) and cubic nonlinear susceptibility (\(\chi ^{3}\)) have been estimated using single-beam Z-scan technique. A concentration-dependent switching of optical nonlinearity has been observed occurring due to internal self-action effects. Optical limiting behavior has also been reported with limiting threshold (\(T_{L}\)). Existence of strong third-order optical nonlinear susceptibility \(({\upchi }^{\mathrm {3}}\)) with quite low limiting threshold (\(T_{L}\)) for visible laser beam confirms that \( \hbox {MoO}_{\mathrm {3}} : \hbox {V}_{\mathrm {2}} \hbox {O}_{\mathrm {5}}\) thin films have a great potential for the applications in photonic devices.
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This manuscript has associated data in a data repository. [Authors’ comment: All data included in this manuscript are available upon request by contracting with the corresponding author.]
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Poonam, Mohan, D., Purnima et al. Third-order optical nonlinearity in molybdenum trioxide (\(\hbox {MoO}_{{3}}\))-doped vanadium pentaoxide (\(\hbox {V}_{{2}} \hbox {O}_{{5}}\)) thin films. Eur. Phys. J. D 75, 243 (2021). https://doi.org/10.1140/epjd/s10053-021-00242-0
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DOI: https://doi.org/10.1140/epjd/s10053-021-00242-0