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Thickness dependence of photoluminescence-decay profiles of exciton-exciton scattering in ZnO thin films

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Abstract

We have investigated the photoluminescence (PL) dynamics of ZnO thin films under intense excitation conditions using an optical-Kerr-gating method. The PL bands originating from exciton-exciton scattering (P emission) and biexciton (M emission) have been observed at 10 K. The ultrashort gating time of 0.6 ps has enabled us to obtain precise information of the temporal profiles of the peak energies and the intensities of the P- and M-PL bands. We have found that the decay time of the P emission becomes longer with increasing film thickness, while that of the M emission is independent of the film thickness. Although the decay time of the P emission is an increasing function of the film thickness, the relation is not in proportion, which is contrary to the predicted proportionality based on a simple model of photon-like polariton propagation.

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Authors and Affiliations

  1. Department of Material and Life Science, Division of Advanced Science and Biotechnology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, 565-0871, Osaka, Japan

    Shuji Wakaiki & Yasuo Kanematsu

  2. Venture Business Laboratory, Osaka University, 2-1 Yamada-oka, Suita, 565-0871, Osaka, Japan

    Hideki Ichida & Yasuo Kanematsu

  3. Department of Applied Physics, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto, Sumiyoshi-ku, 558-8585, Osaka, Japan

    Toshiki Kawase, DaeGwi Kim & Masaaki Nakayama

  4. Department of Physical Science, Graduate School of Science, Osaka Prefecture University, 1-1 Gakuen, Naka-ku, Sakai, 599-8531, Osaka, Japan

    Kohji Mizoguchi

Authors
  1. Shuji Wakaiki
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  2. Hideki Ichida
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  3. Toshiki Kawase
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  4. Kohji Mizoguchi
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  5. DaeGwi Kim
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  6. Masaaki Nakayama
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  7. Yasuo Kanematsu
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Correspondence to Shuji Wakaiki.

Additional information

Contribution to the Topical Issue “Excitonic Processes in Condensed Matter, Nanostructured and Molecular Materials”, edited by Maria Antonietta Loi, Jasper Knoester and Paul H.M. van Loosdrecht.

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Wakaiki, S., Ichida, H., Kawase, T. et al. Thickness dependence of photoluminescence-decay profiles of exciton-exciton scattering in ZnO thin films. Eur. Phys. J. B 86, 387 (2013). https://doi.org/10.1140/epjb/e2013-30631-5

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  • DOI: https://doi.org/10.1140/epjb/e2013-30631-5

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