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Diffraction study of the piezoelectric properties of low quartz

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Abstract.

The effect of a static electric field on the crystal structure of \(\alpha \)-quartz has been determined by Xray diffraction on single crystals. By a stroboscopic technique rocking curves are measured quasi simultaneously for zero field and for two opposite strong fields (28.8 kV/cm) applied in the direction of the crystallographic a-axis. The relative intensity-changes of high order reflections (i.e. sensitive to the core electrons) were measured and analysed by a least squares method technique. The analysis indicates that the bond distances Si-O are very little affected by the field, but both a deformation and a reorientation of the SiO4 tetrahedra are induced. The model is qualitatively in agreement with the small amplitudes of the induced polarisation and the piezoelectric coefficients.

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Authors and Affiliations

  1. Laboratoire de Cristallographie et Modélisation des Matériaux Minéraux et Biologiques, UMR-CNRS-7036, Université Henri Poincaré - Nancy I, 54 506 Vandoeuvre-lés-Nancy Cedex, BP 239, France

    R. Guillot, P. Fertey, N. K. Hansen, P. Allé & C. Lecomte

  2. LURE, Centre Universitaire Paris-Sud, Bât. 209D, BP 34, 91898, Orsay Cedex, France

    E. Elkaím

Authors
  1. R. Guillot
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  2. P. Fertey
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  3. N. K. Hansen
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  4. P. Allé
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  5. E. Elkaím
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  6. C. Lecomte
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Corresponding author

Correspondence to P. Fertey.

Additional information

Received: 22 September 2004, Published online: 23 December 2004

PACS:

61.10.Nz X-ray diffraction - 77.65.-j Piezoelectricity and electromechanical effects - 77.22.Ej Polarization and depolarization - 07.85.Qe Synchrotron radiation instrumentation

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Guillot, R., Fertey, P., Hansen, N.K. et al. Diffraction study of the piezoelectric properties of low quartz. Eur. Phys. J. B 42, 373–380 (2004). https://doi.org/10.1140/epjb/e2004-00393-4

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  • DOI: https://doi.org/10.1140/epjb/e2004-00393-4

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