Abstract
The optical phonon spectrum of the La0.7Sr0.3MnO3 pseudocubic manganite has been investigated by means of far infrared reflectance measurements on high-quality films of different thickness grown by Pulsed Laser Deposition on LaAlO3 and SrTiO3 substrates. The manganite phonon spectrum, as obtained by properly modelling the measured reflectances, does not strongly depend on substrate and film thickness d. Measurements on thick-films (100 < d < 200 nm) on SrTiO3 allow to precisely determine line profile and peak-frequency of bending (\(\nu_{B} = 336\pm 3\) cm-1) and stretching (\(\nu_{S} = 588\pm \)3 cm-1) phonons of the bulk manganite. The bending phonon is broadened by an extra component around 365 cm-1, which strongly decreases in intensity on decreasing d below 100 nm. Although this finding is not yet fully understood, the unambiguous conclusion is that thick-films on SrTiO3 are ideal samples to get detailed information on the phonon spectrum of a bulk manganite.
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Received: 7 January 2004, Published online: 2 April 2004
PACS:
63.20.-e Phonons in crystal lattice - 78.20.-e Optical properties of bulk materials and thin films - 78.30.-j Infrared and Raman spectra
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Dore, P., Funaro, A., Sacchetti, A. et al. Study of infrared phonons in the La \(\mathsf{_{0.7}}\)Sr \(\mathsf{_{0.3}}\)MnO\(\mathsf{_{3}}\) manganite by means of reflectance measurements on epitaxial films. Eur. Phys. J. B 37, 339–344 (2004). https://doi.org/10.1140/epjb/e2004-00064-6
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DOI: https://doi.org/10.1140/epjb/e2004-00064-6