Abstract
New trends in experimental and theoretical investigations of chemisorption on electrodes are considered on examples of in situ spectroscopic studies and the density functional theory calculations. The partial charge transfer during ionic and molecular adsorption from aqueous solutions on coinage and platinum metals and the thermodynamic uncertainty regarding the direction of the charge transfer are discussed. The contact electric resistance technique (CER) was shown to offer a new approach to considering these problems. This technique provides information on the coefficient and direction of the charge transfer, the kinetics of the transformation of the electrode surface during the conversion of adsorbed ions to adatoms, and the role of competitive adsorption of water. It was examined how the charge transfer is related to the electrosorption valence of anions and what the role plays the tunneling of electrons in the generation of the CER signal. The CER was demonstrated to be dependent on the potential E, the coverage, and the residence charge of the adsorbate. For the adsorption of halide ions from aqueous solutions on 1B metals, the bell shaped CER vs. E dependences were obtained. The maxima in these dependences correspond to the onset of substantial charge transfer, their position and amplitudes being determined by the nature of the metal and anion and the concentration of the latter. At E < Emax, halide ions are adsorbed without appreciable charge transfer; within the range Emax (Emax + 0.1 V), the charge transfer for silver and gold approaches 1, being far less for copper. For a given metal, Emax increases in the series I− < Br− ≪ Cl− while for a given anion, Emax increases in the series Au < Ag ≪ Cu. Based on the measured CER-E dependences, a quantitative criterion of the substantial charge transfer during ionic and molecular adsorption was proposed. This criterion was demonstrated to be consistent with the published data on charge transfer in various adsorbate-adsorbent systems. In particular, it shows that the hydrophilicity and electronic properties of 1B metals differently influence charge transfer during ionic and molecular adsorption. New electrosorption equations have been proposed describing the partial charge transfer and screening of the adsorbate charge due to partial ionization of the surface atoms. An experimental approach to solve the “anion problem” in the density functional theory has been developed basing on the CER-measured values of Emax in corresponding electrochemical systems.
Similar content being viewed by others
References
Koper, M.T.M., J. Electroanal. Chem., 2005, vol. 574, no. 2, p. 375.
Nazmutdinov, R.R., Tsirlina, G.A., Petrii, O.A., et al., Electrochim. Acta, 2000, vol. 45, no. 21, p. 3521.
Sass, J.K., Kretzschmar, K., and Holloway, S., Vacuum, 1981, vol. 31, no. 3, p. 483.
Sass, J.K., Lackey, D., and Schott, J., Electrochim. Acta, 1991, vol. 36, no. 11, p. 1879.
Sass, J.K., Lackey, D., Schott, J., and Straehler, B., Surface Sci., 1991, vol. 247, no. 2, p. 239.
Villegas, I., Kizhakevariam, N., and Weaver, M.J., Surface Sci., 1995, vol. 335, no. 2, p. 300.
Villegas, I. and Weaver, M.J., J. Electroanal. Chem., 1997, vol. 426, nos. 1–2, p. 55.
Nakamura, M., Shingaya, Y., and Ito, M., Surface Sci., 2002, vols. 502, 503, no. 2, p. 474.
Lennartz, M., Arenz, M., Stuhlmann, C., and Wandelt, K., Surface Sci., 2000, vol. 461, nos. 1–3, p. 98.
Kim, C.S. and Korzeniewski, C., J. Phys. Chem., 1993, vol. 97, p. 9784.
Stuhlmann, C., Villegas, I., and Weaver, M.J., Chem. Phys. Lett., 1994, vol. 219, no. 2, p. 319.
Mrozek, M.F. and Weaver, M.J., J. Am. Chem. Soc., 2000, vol. 122, no. 1, p. 150.
Wasileski, S.A., Koper, M.T.M., and Weaver, M.J., J. Chem. Phys. B, 2001, vol. 105, p. 3518.
Wasileski, S.A., Koper, M.T.M., and Weaver, M.J., J. Chem. Phys., 2001, vol. 115, p. 8193.
Koper, M.T.M., van Santen, R.A., Wasileski, S.A., and Weaver, M.J., J. Chem. Phys., 2000, vol. 113, p. 4392.
Wasileski, S.A., Koper, M.T.M., and Weaver, M.J., J. Am. Chem. Soc., 2002, vol. 124, p. 2796.
Wasileski, S.A. and Weaver, M.J., J. Electroanal. Chem., 2002, vols. 524, 525, nos. 1, 2, p. 219.
Wasileski, S.A. and Weaver, M.J., Electrochim. Acta, 2002, vol. 47, nos. 22, 23, p. 3611.
Shubina, T.E. and Koper, M.T.M., Electrochim. Acta, 2002, vol. 47, nos. 22, 23, p. 3621.
Hartnig, C., Vassilev, P., and Koper, M.T.M., Electrochim. Acta, 2003, vol. 48, nos. 25, 26, p. 3751.
Pearson, R.G., Chemical Hardness. Application from Molecules to Solids, Weinheim: Wiley-VCH, 1997.
Conway, B.E. and Novak, D.M., J. Chem. Soc., Faraday Trans., 1981, vol. 77, p. 2341.
Conway, B.E., Electrochim. Acta, 1995, vol. 40, no. 10, p. 1501.
Conway, B.E., Solid State Ionics, 1997, vol. 94, no. 1, p. 165.
Conway, B.E., J. Electroanal. Chem., 2002, vols. 524, 525, nos. 1, 2, p. 4.
Magnussen, O.M., Chem. Rev., 2002, vol. 102, no. 3, p. 679.
Mitchel, S.J., Wang, S., and Rikvold, P.A., Faraday Discuss., 2002, vol. 121, no. 1, p. 53.
Rikvold, P.A., Faraday Discuss., 2002, vol. 121, no. 1, p. 97.
Ignaczak, A. and Gomes, J.A.N.F., Chem. Phys. Lett., 1996, vol. 257, no. 3, p. 609.
Ignaczak, A. and Gomes, J.A.N.F., J. Electroanal. Chem., 1997, vol. 420, nos. 1, 2, p. 71.
Vasina, S.Ya. and Petrii, O.A., Electrochimia, 1970, vol. 6, no. 1, p. 242.
Wasberg, M. and Horanyi, G., J. Electroanal. Chem., 1995, vol. 151, nos. 1, 2, p. 151.
Lang, G.G. and Horanyi, G., J. Electroanal. Chem., 2003, vol. 552, nos. 1, 2, p. 197.
Marichev, V.A., Protection of Metals, 2002, vol. 38, no. 5, p. 544.
Marichev, V.A., Russian J. Electrochemistry, 1999, vol. 35, no. 4, pp. 417, 426, 434.
Marichev, V.A., (in press).
Wong, Y-M., Cox, B., Ramasubramanian, N., and Ling, V.C., J. Nuclear Materials, 1999, vol. 265, no. 1, p. 178.
Santra, A.K. and Goodman, D.W., Electrochim. Acta, 2002, vol. 47, nos. 22, 23, p. 3595.
Beltramo, G.L., Shubina, T.E., Mitchell, S.J., and Koper, M.T.M., J. Electroanal. Chem., 2004, vol. 563, nos. 1, 2, p. 111.
Murray, C.A. and Bodoff, S., J. Chem. Phys., 1996, vol. 85, no. 4, p. 573.
Gao, P. and Weaver, M.J., J. Electroanal. Chem., 1987, vol. 233, nos. 1, 2, p. 337; J. Phys. Chem., vol. 90, p. 4059.
Ample, F., Curulla, D., Fuster, F., et al., Surface Sci., 2002, vol. 497, nos. 1–3, p. 139.
Mitchell, J. and Koper, M.T.M., Surface Sci., 2004, vol. 563, no. 1, p. 169.
Nilsson, A. and Pettersson, L.G.M., Surface Sci. Rep., 2004, vol. 55, nos. 2–5, p. 49.
Guo, J.-H., Luo, Y., Augustsson, A., et al., Phys. Rev. Lett., 2002, vol. 89, p. 137 402.
Ample, F., Clotet, A., and Ricart, J.M., Surface Sci., 2004, vol. 558, nos. 1–3, p. 111.
Stefanovich, E.V. and Truong, T.N., J. Chem. Phys., 1007, vol. 106, p. 7700.
Johnson, M.A., Stefanovich, E.V., and Truong, T.N., J. Phys. Chem. B., 1998, vol. 102, p. 6391.
Crispin, X., Geskin, V.M., Bureau, C., et al., J. Chem. Phys., 2001, vol. 115, p. 10 493.
Parr, R.G. and Pearson, R.G., J. Am. Chem. Soc., 1983, vol. 105, p. 7512.
Pearson, R.G., Inorg. Chem., 1988, vol. 27, no. 5, p. 734.
Pearson, R.G., Inorg. Chimica Acta, 1992, vols. 198–200, no. 5, p. 781.
Pearson, R.G., Inorg. Chimica Acta, 1995, vol. 240, p. 93.
Schultze, J.W. and Vetter, K.J., J. Electroanal. Chem., 1973, vol. 44, no. 1, p. 63.
Schultze, J.W. and Koppitz, F.D., Electrochim. Acta, 1975, vol. 21, no. 2, pp. 327, 337.
Schultze, J.W. and Rolle, D., J. Electroanal. Chem., 2003, vol. 552, nos. 1, 2, p. 163.
Inouye, Y. and Kawata, S., Opt. Lett., 1994, vol. 19, no. 1, p. 159.
Hayazawa, N., Inouye, Y., Sekka, Z., and Kawata, S., Opt. Communications, 2000, vol. 183, no. 2, p. 333.
Hayazawa, N., Inouye, Y., Sekkat, Z., and Kawata, S., Chem. Phys. Lett., 2001, vol. 335, no. 2, p. 369.
Stockle, R.M., Suh, E.D., Decker, V., and Zanobi, R., Chem. Phys. Lett., 2000, vol. 318, no. 2, p. 131.
Festy, F., Demming, A., and Richards, D., Ultramicroscopy, 2004, vol. 100, no. 2, p. 437.
Ichimura, T., Hayazawa, N., Hashimoto, M., Ât al., Appl. Phys. Lett., 2004, vol. 84, no. 10, p. 1768.
Ren, B., Picardi, G., and Pettinger, B., Rev. Scient. Instr., 2004, vol. 75, no. 5, p. 837.
Pettinger, B., Picardi, G., Schuster, R., and Ertl, G. J. Electroanal. Chem., 2003, vols. 554, 555, nos. 1, 2, p. 293.
Kolb, D.M., Boeck, W., Ho, K.-M., and Liu, S.H., Phys. Rev. Lett., 1981, vol. 47, p. 1921.
Franke, C., Piazza, G., and Kolb, D.M., Electrochim. Acta, 1989, vol. 34, no. 1, p. 67.
Izvekov, S. and Voth, G.A., J. Chem. Phys., 2001, vol. 115, p. 7196.
Izvekov, S., Mazzolo, A., van Opdorp, K., and Voth, G.A., J. Chem. Phys., 2001, vol. 114, p. 3248.
Vassilev, P., van Santen, R.A., and Koper, M.T.M., J. Chem. Phys., 2005, vol. 122, p. 05401.
Marichev, V.A., Surface Sci., 1991, vol. 205, no. 1, p. 220.
Marichev, V.A, Electrochim. Acta, 1996, vol. 41, no. 16, p. 2551.
Marichev, V.A., Electrochim. Acta, 1998, vol. 43, nos. 14, 15, p. 2203.
Marichev, V.A., Surface Sci. Rep., 2001, vol. 44, nos. 3–6, p. 51.
Marichev, V.A., J. Appl. Electrochem., 2005, vol. 35, no. 1, p. 17.
Morgenstern, M., Mueller, J., Michely, T., et al., Zeits. Phys. Chemie., 1997, vol. 198, no. 1, p. 43.
Mrozek, M.F., Wasileski, S.A., and Weaver, M.J., J. Am. Chem. Soc., 2001, vol. 123, p. 12 817.
Wu, D.-Y., Ren, B., Xu, X., et al., J. Chem. Phys., 2003, vol. 119, p. 1701.
Dima, G.E., Vooys, A.C.A., and Koper, M.T.M., J. Electroanal. Chem., 2003, vols. 554, 555, no. 1, p. 15.
Gajdos, M. and Hafner, J., Surface Sci., 2005, vol. 590, no. 1, p. 117.
Gajdos, M., Eichler, A., and Hafner, J., J. Phys. Condens. Matter., 2004, vol. 16, p. 1141.
Nuerock, M., Wasileski, S.A., and Mei, D., Chem. Eng. Sci., 2004, vol. 59, p. 4703.
Norskov, J.K., Prog. Surface Sci., 1991, vol. 38, no. 1, p. 103.
Tsai, M.H. and Hass, K.S., Phys. Rev. B, 1995, vol. 51, p. 14 616.
Hammer, B., Marikawa, Y., and Norskov, J.K., Phys. Rev. Lett., 1996, vol. 76, p. 2141.
Mavrikakis, M., Hammer, B., and Norskov, J.K. Phys. Rev. Lett., 1998, vol. 81, p. 2819.
Lipkowski, J., Shi, Z., Chen, A., et al., Electrochim Acta, 1998, vol. 43, nos. 19, 20, p. 2875.
Frumkin, A., Damaskin, B., and Petrii, O., J. Electroanal. Chem., 1974, vol. 53, no. 1, p. 57.
Damaskin, B.B., Electrochemistry, 1969, vol. 5, no. 6, p. 771.
Mostani, J., Herrero, E., Feliu, J.M., and Lipkowski, J., J. Electroanal. Chem., 2003, vol. 558, nos. 1, 2, p. 19.
Garcia-Araez, N., Climent, V., Herrero, E., et al., J. Electroanal. Chem., 2005, vol. 576, nos. 1, 2, p. 33.
Garcia-Araez, N., Climent, V., Herrero, E., et al., J. Electroanal. Chem., 2005, vol. 582, nos. 1, 2, p. 76.
Hamad, A., Wandlowsk, Th., Brown, G., and Rikvold, P.A., J. Electroanal. Chem., 2005, vols. 554, 555, nos. 1, 2, p. 211.
Hamad, A., Mitchell, S.J., Wandlowski, Th., et al., Electrochimica Acta, 2005, vol. 50, no. 28, p. 5518.
Haiss, W. and Sass, J.K., J. Electroanal. Chem., 1995, vol. 386, nos. 1, 2, p. 267.
Haiss, W. and Sass, J.K., J. Electroanal. Chem., 1998, vol. 452, nos. 1, 2, p. 199.
Haiss, W., Rep. Phys. Prog., 2001, vol. 64, no. 3, p. 591.
Koper, M.T.M., J. Electroanal. Chem., 1998, vol. 450, nos. 1, 2, p. 189.
Horanyi, G., Thermodynamic and Electrified Interfaces, Encyclopedia of Electrochemistry, Weinheim: Wiley-VCH, 2002, p. 349.
De Levie, R. J. Electroanal. Chem., 2004, vol. 562, nos. 1, 2, p. 273.
Hartnig, C. and Koper, M.T.M., J. Am. Chem. Soc., 2003, vol. 125, p. 9840.
Marichev, V.A., Chem. Phys. Lett., 2005, vol. 411, nos. 4–6, p. 434.
Pauling, L., The Nature of the Chemical Bond. 3d ed., N.Y.: Cornell Univ. Press, 1960, p. 664.
Toney, M.F., Howard, J.H., Richer, J., et al., Nature, 1994, vol. 368, p. 444.
Toney, M.F., Howard, J.H., and Richer, J., Surface Sci., 1995, vol. 335, no. 2, p. 326.
Hartinger, S., Pettinger, B., and Doblhofer, K., J. Electroanal. Chem., 1995, vol. 397, nos. 1, 2, p. 335.
Niaura, G., Electrochim. Acta, 2000, vol. 45, no. 21, p. 3507.
Cere, S., Sanchez, S.R., and Schiffrin, D.J., J. Electroanal. Chem., 1995, vol. 386, nos. 1, 2, p. 165.
Savinova, E.R., Kraft, P., Pettinger, B., and Doblhofer, K., J. Electroanal. Chem., 1997, vol. 430, nos. 1, 2, p. 47.
Horányi, G., Electrochim. Acta, 1991, vol. 36, no. 9, p. 1453.
Tsionsky, V., Daikhin, L., and Gileady, E., J. Electrochem. Soc., 1996, vol. 143, p. 2240.
Zhang, Y., Gao, X., and Weaver, M.J., J. Phys. Chem. B, 1993, vol. 97, p. 8656.
Chan, H.Y.H., Takoudis, C.G., and Weaver, M.J., J. Phys. Chem. B, 1999, vol. 103, p. 357.
Desilvestro, J. and Weaver, M.J., J. Electroanal. Chem., 1986, vol. 209, nos. 1, 2, p. 377.
Schumacher, D., Otto, A., and Persson, B.N.J., Chem. Phys. Lett., 1991, vol. 17, nos. 2, 3, p. 204.
Hein, M., Dumas, P., and Otto, A., Surface Sci., 1999, vol. 419, no. 1, p. 135.
Hanewinkel, C., Otto, A., and Wandlowski, T., Surface Sci., 1999, vol. 429, no. 2, p. 255.
Hein, M., Dumas, P., Otto, A., and Williams, G.P., Surface Sci., 2000, vol. 465, no. 2, p. 249.
Tucceri, R., Surface Sci. Rep., 2004, vol. 56, nos. 3, 4, p. 85.
Endo, O., Kiguchi, M., Yokoyama, T., et al., J. Electroanal. Chem., 1999, vol. 473, nos. 1, 2, p. 19.
Endo, O., Kondoh, H., Yonamoto, Y., et al., Surface Sci., 2000, vol. 463, no. 1, p. 135.
Endo, O., Matsumra, D., Kohdate, K., et al., J. Electroanal. Chem., 2000, vol. 494, nos. 1, 2, p. 121.
Foresti, M.L., Innocenti, M., Forni, F., and Guidelli, R., Langmuir, 1998, vol. 14, p. 7008.
Gomes, J.A.N.F. and Ignaczak, A., J. Mol. Struct. Theochim., 1999, vol. 463, no. 1, p. 113.
Wang, Y., Sun, Q., Fan, K., and Deng, J., Chem. Phys. Lett., 2001, vol. 334, no. 2, p. 411.
Mitchell, S.J., Brown, G., and Rikvold, P.A., J. Electroanal. Chem., 2000, vol. 493, nos. 1, 2, p. 68.
Arenz, M., Stamenkovic, V., Schmidt, T.J., et al., Surface Sci., 2003, vol. 523, no. 1, p. 199.
Gastinger, H.A. and Ross, P.N., Surface Sci., 1997, vol. 372, no. 1, p. 239.
Lucas, C.A., Markovic, N.M., and Ross, P.N., Surface Sci., 1995, vol. 340, nos. 1, 2, p. L949.
Seo, M., Makino, T., and Sato, N., J. Electrochem. Soc., 1986, vol. 133, no. 4, p. 1138.
Seo, M. and Ueno, K., J. Electrochem. Soc., 1996, vol. 143, no. 3, p. 899.
Ueno, K. and Seo, M., Denki Kagaku, 1998, vol. 66, no. 6, p. 713.
Ueno, K. and Seo, M., J. Electrochem. Soc., 1999, vol. 146, no. 5, p. 1496.
Arvia, A.J., Surface Sci., 1987, vol. 181, no. 1, p. 78.
Lee, C.-W. and Bard, A.J., J. Electrochem. Soc., 1998, vol. 135, no. 6, p. 1599.
Cruickshank, B.J., Sneddon, D.N., and Gewirth, A.A., Surface Sci. Lett., 1993, vol. 281, no. 2, p. L308.
Edens, G.J., Gao, X., and Weaver, M.J., J. Electroanal. Chem., 1994, vol. 375, nos. 1, 2, p. 357.
Zou, S., Villegas, I., Stulmann, C., and Weaver, M.J., Electrochim. Acta, 1998, vol. 43, nos. 19, 20, p. 2811.
Cuesta, A. and Kolb, D.M., Surface Sci., 2000, vol. 465, no. 2, p. 310.
Marchiani, S., Sachs, C., and Wintterlin, J.W., Surface Sci., 2005, vol. 592, no. 1, p. 58.
Happ, J.T., Larkin, D., and Weaver, M.J., Surface Sci., 1983, vol. 125, no. 2, p. 429.
Li, H.Q., Roscoe, S.G., and Lipkowski, J., J. Solution Chemistry, 2000, vol. 29, no. 5, p. 987.
Lust, E., Janes A., Miidla, P., and Lust, K., J. Electroanal. Chem., 1997, vol. 425, nos. 1, 2, p. 25.
Hect, D. and Strehblow, D. H.-H., J. Electroanal. Chem., 1997, vol. 440, nos. 1, 2, p. 211.
Rodriguez, J.A., Surface Sci., 1996, vol. 345, no. 2, p. 347.
Olsson, C.-O.A. and Landolt, D., Electrochim. Acta, 2003, vol. 48, no. 9, p. 1093.
Vidal, F., Busson, B., and Tadjeddine, A., Chem. Phys. Lett., 2005, vol. 403, nos. 4–6, p. 324; Vidal, F. and Tadjeddine, A., Rep. Prog. Phys., 2005, vol. 68, p. 1095.
Savich, W., Sun, S.G., Lipkowski, J., and Wieckowski, A., J. Electroanal. Chem., 1994, vol. 388, nos. 1, 2, p. 374.
Shi, Z., Lipkowski, J., Mirwald, S., and Pettinger, B., J. Electroanal. Chem., 1995, vol. 396, nos. 1, 2, p. 115.
Shi, Z., Wu, S., and Lipkowski, J., Electrochim. Acta, 1995, vol. 40, no. 1, p. 9.
Wu, S., Lipkowski, J., Magnussen, O.M., et al., J. Electroanal. Chem., 1998, vol. 446, nos. 1, 2, p. 67.
Chan, A. and Lipkowski, J., J. Phys. Chem. B, 1999, vol. 103, p. 682.
Lang, G., Aramata, A., and Horanyi, G., J. Electroanal. Chem., 2001, vol. 504, nos. 1, 2, p. 225.
Lipkowski, J. and Wieckowski, A., J. Electroanal. Chem., 2001, vol. 504, nos. 1, 2, p. 230.
Horswell, S.L., Pinheiro, A.L., Savinova, E.R., et al., Langmuir, 2004, vol. 20, p. 10 970.
Ocko, B.M., Magnussen, O.M., Adzic, R.R., et al., J. Electroanal. Chem., 1994, vol. 376, nos. 1, 2, p. 35.
Ocko, B.M., Magnussen, O.M., Wang, J.X., et al., J. Phys. B, 1996, vol. 221, no. 1, p. 238.
Reniers, F., J. Phys. D: Appl. Phys., 2002, vol. 35, p. R169.
Shi, Z., Lipkowski, J., Gamboa, M., and Zelenai, P. J. Electroanal. Chem., 1994, vol. 366, nos. 1, 2, p. 317.
Gao, X., Edens, G.J., and Weaver, M.J., J. Electroanal. Chem., 1994, vol. 376, nos. 1, 2, p. 21.
Polewska, W., Vitus, C.M., Ocko, B.M., and Adzic, R.R., J. Electroanal. Chem., 1994, vol. 364, nos. 1, 2, p. 265.
Gokhstein, A.Ya., Surface Tension of Solids and Adsorption, Moscow: Nauka, 1976.
Lazaresku, V., Surface Sci., 1995, vol. 335, no. 1, p. 220.
Foresti, M.L., Aloisi, G., Innocenti, M., et al., Surface Sci., 1995, vol. 335, no. 2, p. 241.
Lipkowski, J. and Stolberg, L., Frontiers in Electrochemistry: Adsorption of Molecules on Metal Electrodes, N.Y.: VCH, 1992, p. 171.
Stolberg, L., Richer, J., Lipkowski, J., and Irish, D.E., J. Electroanal. Chem., 1986, vol. 207, nos. 1, 2, p. 213.
Hoon-Kholsa, M., Fawcett, W.R., Chan, A., et al., Electrochim. Acta, 1999, vol. 45, no. 3, p. 611.
Li, N., Zamlynny, V., Lipkowski, J., et al., J. Electroanal. Chem., 2002, vols. 524, 525, nos. 1, 2, p. 43.
Mayer, D., Dretschkow, Th., Ataka, K., and Wandlowski, Th., J. Electroanal. Chem., 2002, vol. 524, 525, no. 1, 2, p. 20.
Yang, D. and Lipkowski, J., Electochimiya, 1995, vol. 31, no. 6, p. 836.
Calvente, J.J., Kovacova, Z., Andreu, R., and Fawcett, W.R., J. Electroanal. Chem., 1996, vol. 401, nos. 1, 2, p. 231.
Trasatti, S., Electrochim. Acta, 1991, vol. 36, nos. 11, 12, p. 1659.
Trasatti, S. and Doubova, L., J. Chem. Soc., Faraday Trans., 1995, vol. 91, p. 3311.
Moretti, G., Molokanov, V., Quartarone, G., and Zingales, B., Corrosion, 1998, vol. 54, no. 1, p. 135.
Blustein, G., Rodriguez, J., Romanogly, R., and Zinola, C.F., J. Electroanal. Chem., 1999, vol. 478, nos. 1, 2, p. 67.
Blustein, G., Rodriguez, J., Romanogly, R., and Zinola, C.F., Corrosion Sci., 2005, vol. 47, no. 2, p. 369.
Ferral, A., Paredes-Olivera, P., Macagno, V.A., and Patrio, E.M., Surface Sci., 2003, vol. 525, no. 1, p. 85.
Khanova, L.A. and Tarasevich, M.R., Electrochim. Acta, 1991, vol. 36, no. 2, p. 421.
Komeda, T., Progr. Surface Sci., 2005, vol. 78, no. 1, p. 41.
Lee, J., Balabin, I.A., Beratan, D.N., et al., Phys. Rev. Lett., 2005, vol. 412, no. 1, p. 171.
Foresti, M.L., Innocenti, M., Guidelli, R., and Hamelin, A., J. Electroanal. Chem., 1999, vol. 467, nos. 1, 2, p. 217.
Hartinger, S. and Doblhofer, K., J. Electroanal. Chem., 1995, vol. 380, nos. 1, 2, p. 185.
Marichev, V.A., Protection of Metals, 2005, vol. 41, no. 1, p. 123.
Andersson, K., Gomez, A., Glover, C., et al., Surface Sci., 2005, vol. 585, no. 1, p. L183.
Li, N. and Lipkowski, J., J. Electroanal. Chem., 2000, vol. 491, nos. 1, 2, p. 95.
Kazarinov, V.E., Foontikov, A.M., and Tsirlina, G.A., J. Electroanal. Chem., 1990, vol. 282, nos. 1, 2, p. 253.
Marichev, V.A., Protection of Metals, 2002, vol. 38, no. 2, p. 441.
Huerta, F., Morallon, E., Quijada, C., et al., J. Electroanal. Chem., 1999, vol. 463, nos. 1, 2, p. 109.
Al-Jaaf-Goltze, K., Kolb, D.M., and Scherson, D., J. Electroanal. Chem., 1986, vol. 200, nos. 1, 2, p. 353.
Lazarescu, V. and Clavilier, J., Electrochim. Acta, 1998, vol. 44, no. 4, p. 897.
Markovic, N.M. and Ross, P.N., Surface Sci. Rep., 2002, vol. 45, nos. 4–6, p. 117.
Iwasita, T. and Xia, X., J. Electroanal. Chem., 1996, vol. 411, nos. 1, 2, p. 95.
Zolfaghari, A., Conway, B.E., and Jerkiewicz, G., Electrochim. Acta, 2000, vol. 47, p. 1173.
Valincius, G., J. Electroanal. Chem., 1999, vol. 478, nos. 1, 2, p. 40.
Marichev, V.A., Surface Sci. Rep., 2005, vol. 56, no. 8, p. 277.
Guidelli, R. and Schmickler, W., Modern Aspects of Electrochemistry, no. 38, p. 303.
Horanyi, G. and Lang, G.G., J. Colloid Interface Sci., 2006, no. 296, p. 1.
Lang, G.G. and Horanyi, G., Electrochim. Acta, 2006, no. 52, p. 1117.
Rikvold, P.A., Wandlowski, Th., Abou Hamad, I., et al., Electrochim. Acta, 2007, no. 52, p. 1932.
Do Couto, P.C., Estacio, S.G., and Carbal, B.J.C., J. Chem. Phys., 2005, vol. 123, p. 054 510.
Tozer, D.J. and De Proft, F., J. Phys. Chem. A, 2005, vol. 109, p. 8923.
De Proft, F., Sablon, N., Tozer, D.J., and Geerlings, P., Faraday Discuss., 2007, vol. 135, p. 151.
Torrent-Sucarrat, M., Salvador, P., Geerlings, P., and Sola, M., J. Comput. Chem., 2007, vol. 28, p. 574.
Sasaki, S., Aisawa, S., Hirahara, H., et al., J. Europ. Ceramic Soc., 2006, vol. 26, no. 3, p. 655.
Yamaguchi, A., Kato, R., Nishizawa, S., and Teramae, N., Chem. Lett., 2003, vol. 32, p. 798.
Gobi, K.V. and Ohsaka, T., J. Elecroanal. Chem., 2002, vol. 485, nos. 1, 2, p. 61.
Reynes, O., Moutet, G.-C., Royal, G., and Saint-Aman, E., Electrochim. Acta, 2004, vol. 49, nos. 22, 23, p. 3727.
Saario, T. and Marichev, V.A., Final Report EPRI TR-103750, project 3500-10 (EPRI, Palo Alto, CA), 1994.
Author information
Authors and Affiliations
Corresponding author
Additional information
The article is published in the original.
Marichev, V.A., Recent Trends in Experimental and Theoretical Investigations of Chemisorption on Metal-Electrolyte Interface. I. In situ Spectroscopic Studies and the Density Functional Theory Calculations, Protection of Metals and Physical Chemistry of Surfaces, 2009, vol. 45, no. 1.
Rights and permissions
About this article
Cite this article
Marichev, V.A. Recent trends in experimental and theoretical investigations of chemisorption on metal-electrolyte interface. II. Contact electric resistance method. Prot Met Phys Chem Surf 45, 241–276 (2009). https://doi.org/10.1134/S2070205109030010
Published:
Issue Date:
DOI: https://doi.org/10.1134/S2070205109030010