Abstract
This paper is devoted to reversible film media on the basis of vanadium dioxide Al-VO2-D (dielectric) and VO2-D (dielectric), completing the change in optical and electrical properties, respectively, during the photoinduced semiconductor-to-metal phase transition (SMPT). The media were obtained by the air oxidation of vanadium films sputtered in vacuum. The optical and photometric parameters, as well as resolving power, diffraction efficiency, and energy sensitivity of the medium Al-VO2-D (depending on the laser radiation character) are presented, and possible fields of the medium application are outlined. Possible application fields include character indicators, irradiation visualizers, and transparencies for holographic recording. The thermal hysteresis of SMPT in VO2-D media (resistance jump and hysteresis loop width values) was determined depending on the production technology variation. The possibility of applying the VO2-D medium as a thermally sensitive layer of the thermal radiation receiver was demonstrated. The receiver time constant, sensitivity, and fundamental noises imposing limitations on the sensitivity were determined. Different designs of thermal radiation receivers are presented.
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Original Russian Text © A.S. Oleinik, A.V. Fedorov, 2011, published in Rossiiskie Nanotekhnologii, 2011, Vol. 6, Nos. 5–6.
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Oleinik, A.S., Fedorov, A.V. Recording of laser irradiation by reversible film media on the basis of vanadium dioxide. Nanotechnol Russia 6, 387–400 (2011). https://doi.org/10.1134/S1995078011030128
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DOI: https://doi.org/10.1134/S1995078011030128