Abstract
Experimental data obtained in a study of CrSi2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed.
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ACKNOWLEDGMENTS
The X-ray diffraction measurements were made on the equipment of the Materials Science and Diagnostics in Advanced Technologies Center for Collective Use at the Ioffe Physical Technical Institute.
Funding
This study was supported in part by the Ministry of Education and Science of the Russian Federation (project identifier RFMEFI62117X0018, research topic 9.7 (0040-20154-0007).
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Translated by M. Tagirdzhanov
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Kalashnikov, E.V., Gurin, V.N., Nikanorov, S.P. et al. Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System. Tech. Phys. Lett. 45, 687–689 (2019). https://doi.org/10.1134/S106378501907006X
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DOI: https://doi.org/10.1134/S106378501907006X