Abstract
An approach based on the formation of YBa2Cu3O x -interlayer-YBa2Cu3O x multilayer epitaxial structures with high current-carrying ability is proposed. The use of interlayers representing simple cubic oxides (SrTiO3 and CeO2) allows the growth of crystal defects during the formation of a high-temperature superconductor (HTS) layer to be stopped. The phenomenon of current transfer through 10- to 50-nm-thick interlayers has been discovered. Using the proposed approach, it is possible to increase the current-carrying ability in proportion to the number of HTS layers in the structure. This in principle solves the problem of critical current-density degradation with increasing thickness of YBa2Cu3O x layer.
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Original Russian Text © M.Ya. Garaeva, I.A. Chernykh, T.S. Krylova, R.I. Shainurov, E.P. Krasnoperov, M.L. Zanaveskin, 2014, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2014, Vol. 40, No. 20, pp. 47–53.
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Garaeva, M.Y., Chernykh, I.A., Krylova, T.S. et al. Developing an approach based on the formation of YBa2Cu3O x -interlayer-YBa2Cu3O x epitaxial structures with high current-carrying ability. Tech. Phys. Lett. 40, 905–908 (2014). https://doi.org/10.1134/S1063785014100204
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DOI: https://doi.org/10.1134/S1063785014100204