Abstract
The possibility of determining the elastic constants of thin films deposited on the free end of an acoustic line in the transverse direction to the film plane is discussed. The proposed technique is based on measurement of changes in eigenfrequencies of a composite acoustic resonator composed of an acoustic line and an electroacoustic transducer of bulk acoustic waves upon its loading with a thin-film coating. Results of experimental verification of the proposed technique for a thin (3.25 μm) film of DST-30 rubber deposited on the free end of a resonator made of fused quartz with an operating range of 80–150 MHz are described. It is shown that the elasticity of a divinyl styrene rubber film lengthwise and crosswise its plane differs by almost four orders of magnitude.
Similar content being viewed by others
References
V. V. Malov, Piezoresonance Sensors (Energoatomizdat, Moscow, 1989) [in Russian].
J. W. Grate, S. J. Martin, and R. M. White, Anal. Chem. 65, 940A (1993).
J. Janata, M. Josowicz, and M. De Vanney, Anal. Chem. 66, 270R (1994).
Synthetic Rubber, Ed. by I.V. Garmonov, 2nd ed. (Khimiya, Leningrad, 1983).
A. P. Kryuchkov, General Technology for Synthetic Rubbers (Khimiya, Moscow, 1969) [in Russian].
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © S.V. Boritko, 2012, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2012, Vol. 38, No. 15, pp. 34–39.
Rights and permissions
About this article
Cite this article
Boritko, S.V. On the possibility of direct determination of elastic constants of thin films in the transverse direction to the film plane. Tech. Phys. Lett. 38, 703–705 (2012). https://doi.org/10.1134/S1063785012080032
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063785012080032