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Composition and submicron structure of chemically deposited Cu2Se-In2Se3 films

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Abstract

Films of substitutional solid solutions of the Cu2Se-In2Se3 system containing up to 7.5 at. % In have been obtained by chemical deposition from aqueous media. The composition, structure, and morphology of the films have been studied. Data of X-ray diffraction and X-ray photoelectron spectroscopy showed that copper in the solid solution occurs in a single-valence state (Cu+). The deposited layers possess a globular morphology and are nanostructured.

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Correspondence to L. N. Maskaeva.

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Original Russian Text © V.F. Markov, S.S. Tulenin, L.N. Maskaeva, M.V. Kuznetsov, N.M. Barbin, 2012, published in Pis’ma v Zhurnal Tekhnicheskoi Fiziki, 2012, Vol. 38, No. 6, pp. 77–83.

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Markov, V.F., Tulenin, S.S., Maskaeva, L.N. et al. Composition and submicron structure of chemically deposited Cu2Se-In2Se3 films. Tech. Phys. Lett. 38, 290–293 (2012). https://doi.org/10.1134/S1063785012030297

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  • DOI: https://doi.org/10.1134/S1063785012030297

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