Abstract
The formation of axial heterostructures in filamentary nanocrystals (nanowhiskers) is considered within the framework of a two-component diffusion growth model. An expression for the thickness of a heteroboundary is obtained, which is consistent with the available experimental data. Under the usual growth conditions, the thickness of the zone of diffusion smearing of the heteroboundary is on the order of one atomic monolayer, which ensures the high quality of heteroboundaries in nanowhiskers.
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References
V. G. Dubrovskii, G. E. Cirlin, I. P. Soshnikov, et al., Phys. Rev. B 71, 205 325 (2005).
F. Glas, Phys. Rev. B 74, 121 302 (2006).
W. Seifert, M. Borgstrom, K. Deppert, et al., J. Cryst. Growth 272, 211 (2004).
V. G. Dubrovskii, I. P. Soshnikov, G. E. Cirlin, et al., J. Cryst. Growth 289, 31 (2006).
V. G. Dubrovskiĭ and N. V. Sibirev, Pis’ma Zh. Tekh. Fiz. 32(5), 1 (2006) [Tech. Phys. Lett. 32, 185 (2006)].
V. G. Dubrovskioe, N. V. Sibirev, R. A. Suris, et al., Fiz. Tekh. Poluprovod. (St. Petersburg), 40, 1103 (2006) [Semiconductors 40, 1075 (2006)].
V. G. Dubrovskiĭ and N. V. Sibirev, J. Cryst. Growth 304, 504 (2007).
M. Tchernyshova, G. E. Cirlin, G. Patriarche, et al., Nano Lett. 7, 1500 (2007).
D. C. Law, Y. Sun, C. Y. Li, et al., Phys. Rev. B 66, 045314 (2002).
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Original Russian Text © M.V. Nazarenko, N.V. Sibirev, G.É. Cirlin, G. Patriarche, J.-C. Harmand, V.G. Dubrovskiĭ, 2008, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2008, Vol. 34, No. 17, pp. 52–59.
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Nazarenko, M.V., Sibirev, N.V., Cirlin, G.É. et al. Heterostructure formation in nanowhiskers via diffusion mechanism. Tech. Phys. Lett. 34, 750–753 (2008). https://doi.org/10.1134/S1063785008090095
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DOI: https://doi.org/10.1134/S1063785008090095