Abstract
Shallow hydrogen donors (H-donors) were formed in a Ge1 − x Si x (x = 0.012) alloy by the implantation of low-energy protons followed by heat treatment at 275°C The electrical properties of these donors have been studied using the method of capacitance-voltage characteristics. It is established that a certain fraction of the H-donors exhibit bistability, whereby their concentration changes reversibly when the sample temperature is cycled within 100–200°C. The properties of reversible H-donors in germanium are analogous to those of the bistable H-donors in silicon.
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Original Russian Text © Yu.M. Pokotilo, A.N. Petukh, V.V. Litvinov, V.P. Markevich, A.R. Peaker, N.V. Abrosimov, 2008, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2008, Vol. 34, No. 12, pp. 1–5.
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Pokotilo, Y.M., Petukh, A.N., Litvinov, V.V. et al. Bistability of hydrogen donors in proton-implanted GeSi alloy. Tech. Phys. Lett. 34, 498–499 (2008). https://doi.org/10.1134/S106378500806014X
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DOI: https://doi.org/10.1134/S106378500806014X