Abstract
The properties of defect modes in chiral photonic crystals with anisotropic defects are considered. The problem has been solved using the modified method of Ambartsumyan layer addition. The influence of the defect layer thickness and the optical axis orientation on the properties of defect modes is analyzed. At a certain thickness of the defect layer, the medium loses its main property, namely, the polarization dependence of diffraction reflection.
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Original Russian Text © A.H. Gevorgyan, 2006, published in Pis’ma v Zhurnal Tekhnicheskoĭ Fiziki, 2006, Vol. 32, No. 16, pp. 18–27.
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Gevorgyan, A.H. The loss of the polarization dependence of diffraction reflection in chiral photonic crystals in the presence of anisotropic defects. Tech. Phys. Lett. 32, 698–702 (2006). https://doi.org/10.1134/S1063785006080189
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DOI: https://doi.org/10.1134/S1063785006080189