Abstract
An original polarization method for the measurement of thickness of Z-cut uniaxial crystals employs the transmittance measurement of the polarizer–crystal–analyzer system at different rotation angles of the crystal. The mathematical analysis of the method is based on the optics of uniaxial crystals and Jones matrices. A measurement error of no greater than ±0.6 μm is estimated using the formula of a vector sum. Z-cut crystals of congruent lithium niobate with rated thicknesses of 514 and 554 μm are used to experimentally test the method and propose practical recommendations for applications.
Similar content being viewed by others
References
N. A. Khilo, E. S. Petrova, and A. A. Ryzhevich, Quantum Electron. (Moscow) 31, 85 2001.
N. A. Khilo, Opt. Commun. 285, 503 2012.
D. H. Zusin, et al., J. Opt. Soc. Am. A 27, 1828 2010.
S. N. Khonina, S. G. Volotovskii, and S. I. Kharitonov, Comput. Opt. 37, 297 2013.
S. N. Khonina, A. A. Morozov, and S. V. Karpeev, Laser Phys. 24, 056101 2014.
S. N. Khonina, V. D. Paranin, S. V. Karpeev, and A. A.Morozov, Comput. Opt. 38, 598 2014.
V. D. Paranin, S. A. Matyunin, and K. N. Tukmakov, Quantum Electron. (Moscow) 43, 923 2013.
A. V. Shubnikov, Principles of Optical Crystallography (Consultants Bureau, New York, 1960).
S. D. Chetverikov, Method of Crystal-Optical Study of Sections (Gosgeolizdat, Moscow, 1949).
V. D. Paranin and K. N. Tukmakov, Quantum Electronics (Moscow) 44, 371 2014.
A. Yariv and P. Yeh, Optical Waves in Crystals: Propagation and Control of Laser Radiation (Wiley, New York, 1984).
S. A. Akhmanov and S. Yu. Nikitin, Physical Optics (Oxford Univ., New York, 1997).
Yu. S. Kuz’minov, Electrooptical and Nonlinear Optical Crystals of Niobate Lithium (Nauka, Moscow, 1987).
P. V. Novitskii and I. A. Zograf, Estimating the Errors of Measurement Results (Energoizdat, Leningrad, 1991).
Author information
Authors and Affiliations
Corresponding author
Additional information
Original Russian Text © V.D. Paranin, 2015, published in Zhurnal Tekhnicheskoi Fiziki, 2015, Vol. 60, No. 12, pp. 120–123.
Rights and permissions
About this article
Cite this article
Paranin, V.D. Rotation method for the measurement of thickness of Z-cut uniaxial crystals. Tech. Phys. 60, 1854–1858 (2015). https://doi.org/10.1134/S1063784215120166
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063784215120166