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Secondary-ion mass spectrometry of photoconducting targets

  • Electron and Ion Beams, Accelerators
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Abstract

Secondary-ion mass spectrometry of photoconducting CdS-PbS films has revealed a change in the yield of positive secondary ions upon illumination. In the course of bombardment by positive oxygen ions, illumination of the samples by visible light decreases the yield of cadmium ions and increases that of lead ions. The observed phenomena suggest that the secondary-ion photoeffect takes place; these phenomena are called the normal and anomalous secondary-ion photoeffect, respectively. The phenomena observed are explained, and a preliminary quantitative description of these effects is proposed.

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Correspondence to A. A. Serdobintsev.

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Original Russian Text © A.A. Serdobintsev, A.G. Rokakh, S.V. Stetsyura, A.G. Zhukov, 2007, published in Zhurnal Tekhnicheskoĭ Fiziki, 2007, Vol. 77, No. 11, pp. 96–102.

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Serdobintsev, A.A., Rokakh, A.G., Stetsyura, S.V. et al. Secondary-ion mass spectrometry of photoconducting targets. Tech. Phys. 52, 1483–1489 (2007). https://doi.org/10.1134/S1063784207110163

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  • DOI: https://doi.org/10.1134/S1063784207110163

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