Abstract
When manufacturing YBCO structures using traditional methods, a certain compromise is usually reached, namely: films with the relevant morphology, but with low electrophysical parameters are used. In this paper, it is shown that YBCO bridges 4 μm in width with the perfect surface morphology, i.e., without defects, with the critical current density Jc ≥ 3 × 106 A/cm2 at temperature 77 K and critical temperature Tc ≥ 88 K can be obtained using the master mask method. The perfect morphology of the bridge surface, values of the critical current density and critical temperature are retained even after the repeated (additional) deposition of the YBCO layer onto the structure with the master mask. The results obtained from the experiments with fifteen samples suggest that, unlike electrophysical characteristics, the fixation of the standard (basic) parameters of the growth process is not sufficient to obtain the perfect morphology of the YBCO film surface.
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Funding
The study was supported by the Russian Foundation for Basic Research, project no. 20-08-01006. The XRD measurements of samples were accomplished within the governmental quota at the Institute for Physics of Microstructures, Russian Academy of Sciences, project no. GZ 0035-2019-0024-S-01. The equipment of the Common Research Center Physics and Technology of Micro- and Nanostructures was used.
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Translated by N. Semenova
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Masterov, D.V., Pavlov, S.A., Parafin, A.E. et al. On a Possibility to Fabricate YBCO Bridges with the Perfect Surface, Critical Temperature over 88 K and Critical Current Density up to 5 × 106 A/cm2 . Phys. Solid State 62, 1562–1566 (2020). https://doi.org/10.1134/S106378342009019X
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DOI: https://doi.org/10.1134/S106378342009019X