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Magnetization reversal of elliptic Co/Si/Co nanodisks in the field of a magnetic-force microscope probe

  • Proceedings of the XIV International Symposium “Nanophysics and Nanoelectronics-2010” (Nizhni Novgorod, Russia, March 15–19, 2010) Magnetism and Ferroelectricity
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Abstract

The processes of local magnetization reversal of elliptic Co/Si/Co nanodisks under the action of a nonuniform magnetic field of a magnetic-force microscope (MFM) probe have been investigated. The specific features of the distribution of the phase MFM contrast from particles with ferromagnetic and antiferromagnetic configurations of the magnetic moments in neighboring Co layers have been discussed. It has been shown experimentally that, under the action of the probe field, there occur orientational transitions of two types: transitions from the ferromagnetic configuration to the antiferromagnetic configuration due to the reorientation of the magnetization of the upper layer and transitions in the antiferromagnetic configuration with a change in the orientation of the magnetic moment in both ferromagnetic layers. The presented results of micromagnetic simulation of the processes of transformation of the magnetization in such particles under the action of the MFM probe field explain the main regularities of the magnetization reversal processes.

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Authors and Affiliations

  1. Institute for Physics of Microstructures, Russian Academy of Sciences, ul. Ul’yanova 46, Nizhni Novgorod, 603950, Russia

    V. L. Mironov, A. A. Fraerman, B. A. Gribkov, O. L. Ermolaeva, S. A. Gusev & S. N. Vdovichev

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  1. V. L. Mironov
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  2. A. A. Fraerman
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  3. B. A. Gribkov
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  4. O. L. Ermolaeva
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  5. S. A. Gusev
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  6. S. N. Vdovichev
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Correspondence to V. L. Mironov.

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Original Russian Text © V.L. Mironov, A.A. Fraerman, B.A. Gribkov, O.L. Ermolaeva, S.A. Gusev, S.N. Vdovichev, 2010, published in Fizika Tverdogo Tela, 2010, Vol. 52, No. 11, pp. 2153–2158.

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Mironov, V.L., Fraerman, A.A., Gribkov, B.A. et al. Magnetization reversal of elliptic Co/Si/Co nanodisks in the field of a magnetic-force microscope probe. Phys. Solid State 52, 2297–2302 (2010). https://doi.org/10.1134/S1063783410110156

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  • DOI: https://doi.org/10.1134/S1063783410110156

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