Abstract
The transport properties of Mg2 X 0.4Sn0.6 (X = Si, Ge) solid solutions are investigated. It is shown that these materials can be rendered p-type with a hole concentration of up to 4 × 1019 cm−3. The Hall coefficient, thermopower, and electrical conductivity are measured over a wide temperature range. The mobility of holes in these solid solutions is less than that of electrons by a factor of 2 for Mg2Si0.4Sn0.6 and by a factor of 1.5 for Mg2Ge0.4Sn0.6. Solid solutions in the Mg2Ge-Mg2Sn system appear more promising for thermoelectric applications.
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Original Russian Text © M.I. Fedorov, V.K. Zaĭtsev, I.S. Eremin, E.A. Gurieva, A.T. Burkov, P.P. Konstantinov, M.V. Vedernikov, A.Yu. Samunin, G.N. Isachenko, A.A. Shabaldin, 2006, published in Fizika Tverdogo Tela, 2006, Vol. 48, No. 8, pp. 1402–1406.
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Fedorov, M.I., Zaĭtsev, V.K., Eremin, I.S. et al. Transport properties of Mg2 X 0.4Sn0.6 solid solutions (X = Si, Ge) with p-type conductivity. Phys. Solid State 48, 1486–1490 (2006). https://doi.org/10.1134/S1063783406080117
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DOI: https://doi.org/10.1134/S1063783406080117