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Effect of X-Ray Radiation on the Optical Properties of Photorefractive Bismuth-Silicate Crystals

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Abstract

The results of investigations of the optical-absorption spectra of bismuth-silicate (Bi12SiO20) single crystals are presented. The band-gap width and the characteristic Urbach energy are determined. The effect of preliminary X-ray irradiation on the behavior of the experimental spectral dependences and the values of the characteristic parameters induced by the bismuth-silicate defect structure is established.

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Authors and Affiliations

  1. Herzen State Pedagogical University of Russia, 191186, St. Petersburg, Russia

    V. T. Avanesyan, I. V. Piskovatskova & V. M. Stozharov

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  1. V. T. Avanesyan
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  2. I. V. Piskovatskova
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  3. V. M. Stozharov
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Correspondence to V. T. Avanesyan.

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Translated by V. Bukhanov

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Avanesyan, V.T., Piskovatskova, I.V. & Stozharov, V.M. Effect of X-Ray Radiation on the Optical Properties of Photorefractive Bismuth-Silicate Crystals. Semiconductors 53, 1024–1027 (2019). https://doi.org/10.1134/S1063782619080049

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  • DOI: https://doi.org/10.1134/S1063782619080049

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