Abstract
Two different procedures for estimating the electron affinity of SiC polytypes and the interrelation of these procedures with the results of ab initio calculations are discussed. Simple corrections to the Shockley–Anderson rules for the constructions of band diagrams of heterojunctions are proposed.
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REFERENCES
Silicon Carbide: Recent Major Advances, Ed. by W. J. Choyke, H. Matsunami, and G. Pensl (Springer, Berlin, Heidelberg, 2004). http://www.springer.de.
Advances in Silicon Carbide. Processing and Applications, Ed. by S. E. Saddow, and A. Agarwal (Artech House, Boston, London, 2004). www.artechhouse.com.
A. A. Lebedev, Semicond. Sci. Technol. 21, R17 (2006).
H. Hibino, H. Kagoshima, and M. Nagase, J. Phys. D: Appl. Phys. 42, 374005 (2010).
F. Bechstedt and R. Enderlein, Semiconductor Surfaces and Interfaces (Akademie, Berlin, 1988).
A. Fissel, Phys. Rep. 379, 149 (2003).
W. R. L. Lambrecht, S. Limpijumnong, S. N. Rashkeev, and B. Segall, Phys. Status Solidi B 202, 5 (1997).
F. Bechstedt, P. Kackell, A. Zywietz, K. Karch, B. Adolph, K. Tenelsen, and J. Furthmüller, Phys. Status Solid B 202, 35 (1997).
G. Wellenhofer and U. Rossler, Phys. Status Solidi B 202, 107 (1997).
V. I. Gavrilenko, A. M. Grekhov, D. V. Korbutyak, and V. G. Litovchenko, Optical Properties of Semiconductors, The Handbook (Nauk. Dumka, Kiev, 1987) [in Russian].
M. Shur, S. Rumyantsev, and M. Levinshtein, Properties of Advanced Semiconductor Materials. GaN, AlN, InN, BN, SiC (Wiley, New York, 2001).
E. T. Yu, J. O. McCaldin, and T. S. McGill, Solid State Phys. 46, 1 (1992).
S. Yu. Davydov, A. A. Lebedev, and O. V. Posrednik, Semiconductors 39, 1391 (2005).
S. Yu. Davydov, Semiconductors 41, 696 (2007).
N. D. Sorokin, Yu. M. Tairov, V. F. Tsvetkov, and M. A. Chernov, Sov. Phys. Crystallogr. 28, 539 (1983).
V. N. Brudny and A. V. Kosobutsky, Superlatt. Microstruct. 111, 499 (2017).
J. Kuriplach, M. Sob, G. Brauer, W. Anwand, E.-M. Nicht, P. G. Coleman, and N. Wagner, Phys. Rev. B 59, 1948 (1999).
M. Wiets, M. Weinelt, and T. Fauster, Phys. Rev. B 68, 125321 (2003).
W. van Haeringen, P. A. Bobbert, and W. H. Backes, Phys. Status Solidi B 202, 63 (1997).
Y. Matsushita, S. Furuya, and A. Oshiyama, J. Phys. Soc. Jpn. 83, 094713 (2014).
A. Arvanitopoulos, N. Lophitis, S. Perkins, K. N. Gyftrakis, G. Belanche, M. Guadas, and M. Antoniou, in Proceedings of the IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, 2017. https://doi.org/10.1109/DEMPED.2017.8062411
N. Fujimura, A. Ohta, K. Makihara, and S. Miyazaki, Jpn. J. Appl. Phys. 55, 08PC06 (2016).
M. Rejhon, J. Franc, V. Dedic, P. Hlidek, and J. Kunc, arXiv:1712.0256324; Y. Matsushita, S. Furuya, and A. Oshiyama, Phys. Rev. Lett. 108, 246404 (2012).
Y. Matsushita, S. Furuya, A. Oshiyama. Phys. Rev. Lett., 108, 246404 (2012).
Y. Sugihara, K. Uchida, and A. Oshiyama, J. Phys. Soc. Jpn. 84, 084709 (2015).
S. Yu. Davydov, Adsorption Theory: Model Hamiltonian Method (LETI, St. Petersburg, 2013) [in Russian]. twirpx.com/file/1596114/.
S. Yu. Davydov and S. V. Troshin, Phys. Solid State 49, 1583 (2007).
C. Persson and U. Lindefelt, Mater. Sci. Forum 264–268, 275 (1998).
S. Yu. Davydov, Tech. Phys. 59, 624 (2014).
S. Yu. Davydov, Semiconductors 48, 46 (2014).
S. Yu. Davydov, Phys. Solid State 58, 1222 (2016).
C.-J. Tong, H. Zhang, Y.-N. Zhang, H. Liu, and L.-M. Liu, J. Mater. Chem. A 2, 17971 (2014).
I. V. Antonova, Semiconductors 50, 66 (2016).
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Davydov, S.Y. On Estimates of the Electron Affinity of Silicon-Carbide Polytypes and the Band Offsets in Heterojunctions Based on These Polytypes. Semiconductors 53, 699–702 (2019). https://doi.org/10.1134/S106378261905004X
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DOI: https://doi.org/10.1134/S106378261905004X