Abstract
Unrelaxed InAs1–x Sb x (x = 0.43 and 0.38) alloy layers are produced by molecular-beam epitaxy on compositionally graded GaInSb and AlGaInSb buffer layers. The high quality of the thin films produced is confirmed by the results of high-resolution X-ray diffraction analysis and micro-Raman studies. The twomode type of transformation of the phonon spectra of InAs1–x Sb x alloys is established.
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Original Russian Text © R.R. Guseynov, V.A. Tanriverdiyev, G. Kipshidze, Ye.N. Aliyeva, Kh.V. Aliguliyeva, N.A. Abdullayev, N.T. Mamedov, 2017, published in Fizika i Tekhnika Poluprovodnikov, 2017, Vol. 51, No. 4, pp. 551–557.
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Guseynov, R.R., Tanriverdiyev, V.A., Kipshidze, G. et al. In As1–x Sb x heteroepitaxial structures on compositionally graded GaInSb and AlGaInSb buffer layers. Semiconductors 51, 524–530 (2017). https://doi.org/10.1134/S1063782617040066
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DOI: https://doi.org/10.1134/S1063782617040066