Abstract
InAs single hetero structure photodiodes were considered as alternatives to cooled CdHgTe-based detectors sensitive to radiation around 3 μm spectral region in a wide temperature range 77–300 K. Estimations of detectivity as well as p-n junction position in InAs heterostructures have been obtained via photoelectrical and AFM measurements.
Similar content being viewed by others
References
G. Yu. Sotnikova, S. E. Aleksandrov, and G. A. Gavrilov, Proc. SPIE 8073, 80731D (2011). doi: 10.1117/12.886309
A. A. Kuznetsov, O. B. Balashov, E. V. Vasil’ev, S. A. Loginov, A. I. Lugovskoi, and E. Ya. Cherniak, Prib. Sist. Upravl., Kontrol’, Diagn., No. 6, 55 (2003).
M. G. Mauk and V. M. Andreev, Semicond. Sci. Technol. 18, S191 (2003).
V. A. Gevorkyan, V. M. Aroutiounian, K. M. Gambaryan, M. S. Kazaryan, K. J. Touryan, and M. W. Wanlass, Thin Sol. Films 451–452, 124 (2004).
A. V. Pentsov, S. V. Slobodchikov, N. M. Stus’, and G. M. Filaretova, USSR Inventor’s Application No. 3207490 (1988).
V. V. Tetyorkin, A. V. Sukach, S. V. Stariy, N. V. Zotova, S. A. Karandashev, B. A. Matveev, and N. M. Stus, Proc. SPIE 5957, 59570Z (2005). doi: 10.1117/12.622181
N. V. Zotova, S. A. Karandashev, B. A. Matveev, A. V. Pentsov, S. V. Slobodchikov, N. N. Smirnova, N. M. Stus’, G. N. Talalakin, and I. I. Markov, Proc. SPIE 1587, 334 (1992). doi:10.1117/12.56559
X. Y. Gong, T. Yamaguchi, H. Kan, T. Makino, T. Iida, T. Kato, M. Aoyama, Y. Hayakawa, and M. Kumagawa, J. Appl. Phys. 36, 2614 (1997).
B. A. Matveev, N. V. Zotova, S. A. Karandashev, M. A. Remennyi, N. M. Stus’, and G. N. Talalakin, SPIE 4650, 173 (2002).
R. K. Lal and P. Chakrabarti, Opt. Quantum Electron. 36, 935 (2004).
M. Ahmetoglu (Afrailov), Infrared Phys. Technol. 53, 29 (2010).
N. D. Il’inskaya, S. A. Karandashev, N. M. Latnikova, A. A. Lavrov, B. A. Matveev, A. S. Petrov, M. A. Remennyi, E. N. Sevost’yanov, and N. M. Stus’, Tech. Phys. Lett. 39, 818 (2013).
P. N. Brunkov, N. D. Il’inskaya, S. A. Karandashev, A. A. Lavrov, B. A. Matveev, M. A. Remennyy, N. M. Stus’, and A. A. Usikova, Infrared Phys. Technol. 64, 62 (2014).
N. V. Zotova, S. A. Karandashov, B. A. Matveev, M. A. Remennyi, N. M. Stus’, and G. N. Talalakin, Semiconductors 33, 920 (1999).
N. V. Zotova, S. A. Karandashev, B. A. Matveev, M. A. Remennyy, A. Yu. Rybal’chenko, and N. M. Stus’, Semiconductors 45, 543 (2011). doi: 10.1134/S1063782611040245
S. B. Kuntze, D. Ban, and E. H. Sargent, Crit. Rev. Solid State Mater. Sci., No. 30, 71 (2005).
C. H. Kuan, R. M. Lin, S. F. Tang, and T. P. Sun, J. Appl. Phys. 80, 5454 (1996). doi: 10.1063/1.362734
A. Krier, H. H. Gao, and Y. Mao, Semicond. Sci. Technol. 13, 950 (1998), PII: S0268-1242(98)91383-9
P. J. Ker, A. R. J. Marchall, J. P. R. David, and C. H. Tan, Phys. Status Solidi C 9, 310 (2012). doi: 10.1002/pssb.201100277
Author information
Authors and Affiliations
Corresponding author
Additional information
The article is published in the original.
Rights and permissions
About this article
Cite this article
Brunkov, P.N., Il’inskaya, N.D., Karandashev, S.A. et al. P-InAsSbP/n 0-InAs/n +-InAs photodiodes for operation at moderate cooling (150–220 K). Semiconductors 48, 1359–1362 (2014). https://doi.org/10.1134/S1063782614100066
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1063782614100066