Abstract
It is shown that, by using a gyratron, it is possible to control the position of a p-n junction in an already fabricated light-emitting structure. A shift of the compensated region in the emitting structure based on GaAs:Si is caused by the motion of impurities in the field of thermoelastic stresses appearing in the course of sample cooling after gyrotronic irradiation.
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Original Russian Text © G.A. Sukach, V.V. Kidalov, 2011, published in Fizika i Tekhnika Poluprovodnikov, 2011, Vol. 45, No. 12, pp. 1633–1636.
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Sukach, G.A., Kidalov, V.V. Movement of the boundary of a p-n junction in GaAs:Si under gyrotronic irradiation. Semiconductors 45, 1571–1574 (2011). https://doi.org/10.1134/S106378261112013X
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DOI: https://doi.org/10.1134/S106378261112013X