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Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers

  • Nonelectronic Properties of Semiconductors (Atomic Structure, Diffusion)
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Abstract

The results of investigations of the morphology (grain size, twinning, growth features), elemental composition, and some mechanical properties of polycrystalline CdTe layers deposited on nonoriented substrates in a quasi-closed volume are presented. Dependences of microhardness on the crystallite size and layer thickness are presented. The evaluation calculations of the stresses on the substrate-layer interface caused by a difference in the linear thermal expansion coefficients are presented.

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Authors and Affiliations

  1. Lviv Polytechnic National University, 79013, Lviv, Ukraine

    I. V. Kurilo, H. A. Ilchuk, S. V. Lukashuk, I. O. Rudyi, V. O. Ukrainets & N. V. Chekaylo

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  1. I. V. Kurilo
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  2. H. A. Ilchuk
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  3. S. V. Lukashuk
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  4. I. O. Rudyi
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  5. V. O. Ukrainets
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  6. N. V. Chekaylo
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Correspondence to I. V. Kurilo.

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Original Russian Text © I.V. Kurilo, H.A. Ilchuk, S.V. Lukashuk, I.O. Rudyi, V.O. Ukrainets, N.V. Chekaylo, 2011, published in Fizika i Tekhnika Poluprovodnikov, 2011, Vol. 45, No. 12, pp. 1591–1598.

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Kurilo, I.V., Ilchuk, H.A., Lukashuk, S.V. et al. Morphology, elemental composition, and mechanical properties of polycrystalline CdTe layers. Semiconductors 45, 1531–1537 (2011). https://doi.org/10.1134/S1063782611120086

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