Abstract
The effect of ionizing radiation of 60Co γ-ray photons in the dose range 104–2 × 109 rad on metal-semiconductor Au-ZrB x -AlGaN/GaN and Au-TiB x -Al-Ti-n-GaN contacts and Au-ZrB x -n-GaN Schottky diodes is examined. The contacts with the TiB x and ZrB x diffusion barriers do not degrade under the effect of ionizing radiation if the dose does not exceed 108 rad. The Au-ZrB x -n-GaN Schottky diodes remain stable in the dose range 104–106 rad. As the radiation dose is increased to ≳108 rad, the damage to the contact metallization increases and is accompanied by formation of through pores, which is conducive to accumulation of oxygen at the Au-ZrB x (TiB x ) interfaces and to an increase in mass transport of atoms in contact-forming layers. In this case, irradiation-caused degradation of the Schottky diodes is observed. Possible mechanisms of radiation damage of contact structures with diffusion barriers are analyzed.
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Original Russian Text © A.E. Belyaev, N.S. Boltovets, R.V. Konakova, V.V. Milenin, Yu.N. Sveshnikov, V.N. Sheremet, 2010, published in Fizika i Tekhnika Poluprovodnikov, 2010, Vol. 44, No. 4, pp. 467–475.
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Belyaev, A.E., Boltovets, N.S., Konakova, R.V. et al. Radiation damage of contact structures with diffusion barriers exposed to irradiation with 60Coγ-ray photons. Semiconductors 44, 448–456 (2010). https://doi.org/10.1134/S106378261004007X
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DOI: https://doi.org/10.1134/S106378261004007X