Abstract
The inherent inhomogeneity of potential on the doped-semiconductor surface during the formation of equilibrium diffusion distribution for an electroactive impurity in the space-charge layers is discussed. The characteristic random-potential values are determined in the case of nondegenerate surface electron gas. The dependence of these inhomogeneities on the surface and bulk parameters is shown.
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Original Russian Text © V.B. Bondarenko, S.N. Davydov, A.V. Filimonov, 2010, published in Fizika i Tekhnika Poluprovodnikov, 2010, Vol. 44, No. 1, pp. 44–47.
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Bondarenko, V.B., Davydov, S.N. & Filimonov, A.V. Inherent potential inhomogeneity on the semiconductor surface for equilibrium impurity distribution. Semiconductors 44, 41–44 (2010). https://doi.org/10.1134/S1063782610010069
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DOI: https://doi.org/10.1134/S1063782610010069