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Carbon nanomaterial studied by atomic-force and electron microscopies

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Abstract

It is suggested to use the atomic-force microscopy (AFM) and transmission electron microscopy (TEM) to study carbon material synthesized by catalytic pyrolysis of ethanol. It is shown how AFM and TEM can be employed to determine the geometric parameters of carbon nanofibers and nanotubes, examine their mechanical and adhesion characteristics, and analyze their structure.

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References

  1. A. V. Eletskĭ, Usp. Fiz. Nauk 167, 945 (1997) [Phys. Usp. 40, 899 (1997)].

    Article  Google Scholar 

  2. M. P. Anantram and F. Leonard, Rep. Prog. Phys., No. 69, 507 (2006).

  3. É. G. Rakov, Khim. Tekhnol., No. 10, 2 (2003).

  4. K. V. Gorshkov and M. M. Simunin, in Proceedings of the Conference “Microelectronics and Informatics-2005” (MIÉT, Moscow, 2005), p. 40.

    Google Scholar 

  5. I. I. Bobrinetskĭ, V. K. Nevolin, A. A. Stroganov, and Yu. A. Chaplygin, Mikroelektronika 33, 359 (2004).

    Google Scholar 

  6. V. N. Kukin, N. I. Borgardt, A. V. Agafonov, and V. O. Kuznetsov, Zavod. Lab. Diagnostika Mater., No. 11, 24 (2005).

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Correspondence to V. K. Nevolin.

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Original Russian Text © I.I. Bobrinetskĭ, V.N. Kukin, V.K. Nevolin, M.M. Simunin, 2008, published in Izvestiya vysshikh uchebnykh zavedenii. Elektronika, 2008, Vol. 42, No. 13.

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Bobrinetskĭ, I.I., Kukin, V.N., Nevolin, V.K. et al. Carbon nanomaterial studied by atomic-force and electron microscopies. Semiconductors 42, 1496–1498 (2008). https://doi.org/10.1134/S1063782608130083

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  • DOI: https://doi.org/10.1134/S1063782608130083

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