Abstract
The growth of 4 H-polytype silicon carbide ingots by the modified Lely method on (10\( \bar 1 \)0) seeds has been investigated. It is shown that this seed plane allows intense ingot outgrowth. Single-crystal ingots up to 60 mm in diameter can be obtained at growth rates below 0.6 mm/h. Investigation of the defect structure showed that the grown ingots are practically micropipe-free but contain stacking faults and carbon inclusions.
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Original Russian Text © D.D. Avrov, A.V. Bulatov, S.I. Dorozhkin, A.O. Lebedev, Yu.M. Tairov, 2008, published in Fizika i Tekhnika Poluprovodnikov, 2008, Vol. 42, No. 12, pp. 1483–1487.
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Avrov, D.D., Bulatov, A.V., Dorozhkin, S.I. et al. Growth of 4H-polytype silicon carbide ingots on (10\( \bar 1 \)0) seeds. Semiconductors 42, 1450–1453 (2008). https://doi.org/10.1134/S1063782608120142
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DOI: https://doi.org/10.1134/S1063782608120142