Abstract
The effect of irradiation of 4H-SiC ionizing-radiation detectors with various doses (as high as 1016 cm−2) of 24-GeV protons is studied. Isotopes of B, Be, Li, He, and H were produced in the nuclear spallation reactions of protons with carbon. Isotopes of Al, Mg, Na, Ne, F, O, and N were produced in the reactions of protons with silicon. The total amount of the produced stable isotopes varied in proportion with the radiation dose from 1.2 × 1011 to 5.9 × 1013 cm−2. It is shown that, at high radiation doses, the contact characteristics of the detectors change appreciably. The potential-barrier height increased from the initial value of 0.7–0.75 eV to 0.85 eV; the rectifying characteristics of the Schottky contacts deteriorated appreciably. These effects are attributed to the formation of a disordered structure of the material as a result of irradiation.
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Original Russian Text © V. Kažukauskas, R. Jasiulionis, V. Kalendra, J.-V. Vaitkus, 2007, published in Fizika i Tekhnika Poluprovodnikov, 2007, Vol. 41, No. 3, pp. 356–363.
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Kažukauskas, V., Jasiulionis, R., Kalendra, V. et al. The effect of irradiation with high-energy protons on 4H-SiC detectors. Semiconductors 41, 345–352 (2007). https://doi.org/10.1134/S1063782607030190
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DOI: https://doi.org/10.1134/S1063782607030190